Microstructural, optical, and electrical characteristics of Cu-doped CdTe nanocrystalline films for designing absorber layer in solar cell applications

Author(s):  
Meshal Alzaid ◽  
N. M. A. Hadia ◽  
M. El-Hagary ◽  
E. R. Shaaban ◽  
W. S. Mohamed
2021 ◽  
Author(s):  
Meshal Alzaid ◽  
N. M. A. Hadia ◽  
M. El-Hagary ◽  
E. R. Shaaban ◽  
wael ahmed

Abstract This paper reports the microstrcure, optical and electrical characteristics of undoped and Cu doped CdTe nanostructured thin films prepared on glass substrates by electron beam evaporation technique. The Crystallographic study of X-ray diffraction shows that CdTe and Cu doped CdTe films crystallize in the form of a cubic zinc blende structure. Microstructure analysis reveals that as the Cu doping level increases, the average crystallite size increases, while the microstrian decreases due to the improvement of the crystallinty, thereby reducing defects. XRD and AFM investigations confirmed the nanostructure characteristic of undoped and Cu doped films. It was found that the optical band gap energy increases from 1.485 eV to 1.683 eV as the Cu concentration increases from 0 wt. % to 10 wt. %, which may be related to the Burstein-Moss effect. The refractive index is calculated from the Swanepoel envelope method and found to decrease with the increase of the Cu doping due to the decrease in the prolizability. Similarly, the extinction coefficient decreases with the increase of Cu in CdTe matrix. The dc electrical conductivity is found to increase with increasing Cu doping, which is attributed to the increase in the grain size, thereby reducing the scattering of the grain boundary. Furthermore, two conduction mechanisms of the carrier transport in nanostrcutured undoped and Cu doped CdTe films were observed. The low temperature dependence of the conductivity of undoped and Cu doped CdTe nanostructured films is explained based on Mott’s variable range hopping conduction mechanism model (VRH). Interestingly, the calculated values of hopping distance R, the hopping energy W and the the density of states at the Fermi level N(EF) are consistent with the Mott's VRH. Finally, Hall effect measurements show that all the films have p- type conduction behavior. Besides, the results show that as Cu doping level increases, the carrier concentration and the Hall mobility increase due to the decrease in grain boundary scattering with the increase in grain size. Accordingly, it can be concluded that by increasing the Cu doping level in the CdTe film, the conductivity is increased, thereby improving the performance of the CdTe absorber layer in the solar cell structure.


2019 ◽  
Vol 2 (1) ◽  
pp. 11-18
Author(s):  
Ravi Kant Rajan ◽  
◽  
C. Bhuvaneswari ◽  
P. Natarajan ◽  
G. Venkatesan ◽  
...  

Author(s):  
Sachin Rondiya ◽  
Avinash Rokade ◽  
Ashok Jadhavar ◽  
Shruthi Nair ◽  
Madhavi Chaudhari ◽  
...  

2011 ◽  
Vol 20 (3) ◽  
pp. 225-232 ◽  
Author(s):  
Kwang-Mook Park ◽  
Jee-Hee Jung ◽  
So-Ik Bae ◽  
Si-Young Choi ◽  
Myoung-Bok Lee

2021 ◽  
Vol 2114 (1) ◽  
pp. 012044
Author(s):  
Mussab J. Ahmed ◽  
Ayed N. Saleh

Abstract In this research, the effect of bulk defect on the performance of the solar cell was studied by using the AFORS-HET simulation program. This was done by varying the density of defects including both Acceptor-like and donor-like within the SnS absorption layer. The thickness of the SnS layer was changed from 600nm to 9000nm with the change in bulk defect density in the same layer from (1E10 to 1E17 cm−3). The results showed that when the density of defects is less than 1E14cm−3, it has no effect on the performance of the solar cell, but its effect appears after this concentration, On the contrary, it is the effect of thickness, the results showed that the change in thickness at the defect density of E16cm−3 does not affect on the optical and electrical properties. Also, the results showed that the effect of defects is greatest at low concentrations of Na impurities, and this effect begins to decrease with increasing the concentration of impurities.


2019 ◽  
Vol 66 (3) ◽  
pp. 1377-1385 ◽  
Author(s):  
Astha Tyagi ◽  
Kunal Ghosh ◽  
Anil Kottantharayil ◽  
Saurabh Lodha

Energies ◽  
2020 ◽  
Vol 13 (18) ◽  
pp. 4667
Author(s):  
Laurentiu Fara ◽  
Irinela Chilibon ◽  
Ørnulf Nordseth ◽  
Dan Craciunescu ◽  
Dan Savastru ◽  
...  

This study is aimed at increasing the performance and reliability of silicon-based heterojunction solar cells with advanced methods. This is achieved by a numerical electro-optical modeling and reliability analysis for such solar cells correlated with experimental analysis of the Cu2O absorber layer. It yields the optimization of a silicon tandem heterojunction solar cell based on a ZnO/Cu2O subcell and a c-Si bottom subcell using electro-optical numerical modeling. The buffer layer affinity and mobility together with a low conduction band offset for the heterojunction are discussed, as well as spectral properties of the device model. Experimental research of N-doped Cu2O thin films was dedicated to two main activities: (1) fabrication of specific samples by DC magnetron sputtering and (2) detailed characterization of the analyzed samples. This last investigation was based on advanced techniques: morphological (scanning electron microscopy—SEM and atomic force microscopy—AFM), structural (X-ray diffraction—XRD), and optical (spectroscopic ellipsometry—SE and Fourier-transform infrared spectroscopy—FTIR). This approach qualified the heterojunction solar cell based on cuprous oxide with nitrogen as an attractive candidate for high-performance solar devices. A reliability analysis based on Weibull statistical distribution establishes the degradation degree and failure rate of the studied solar cells under stress and under standard conditions.


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