The Determination of the Effective Radius of the Tip of the Probe of an Atomic Force Microscope Using Monodispersed Silicon Oxide Nanoparticles

2014 ◽  
Vol 56 (12) ◽  
pp. 1343-1346 ◽  
Author(s):  
A. A. Efimov ◽  
V. V. Ivanov ◽  
I. A. Volkov ◽  
A. A. Lizunova ◽  
S. V. Lisovskii ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Silicon Oxide ◽  
Effective Radius ◽  
Oxide Nanoparticles ◽  
Atomic Force ◽  
Silicon Oxide Nanoparticles

Determination of performance on tunnel conduction through molecular wire using a conductive atomic force microscope

2001 ◽  
Vol 79 (22) ◽  
pp. 3708-3710 ◽  
Author(s):  
Hiroshi Sakaguchi ◽  
Atsushi Hirai ◽  
Futoshi Iwata ◽  
Akira Sasaki ◽  
Toshihiko Nagamura ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Molecular Wire ◽  
Atomic Force

scholarly journals Direct-write polymer nanolithography in ultra-high vacuum

2012 ◽  
Vol 3 ◽  
pp. 52-56 ◽  
Author(s):  
Woo-Kyung Lee ◽  
Minchul Yang ◽  
Arnaldo R Laracuente ◽  
William P King ◽  
Lloyd J Whitman ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Silicon Oxide ◽  
High Vacuum ◽  
Polymer Chains ◽  
Ultra High Vacuum ◽  
Direct Write ◽  
Polymer Nanostructures ◽  
Atomic Force

Polymer nanostructures were directly written onto substrates in ultra-high vacuum. The polymer ink was coated onto atomic force microscope (AFM) probes that could be heated to control the ink viscosity. Then, the ink-coated probes were placed into an ultra-high vacuum (UHV) AFM and used to write polymer nanostructures on surfaces, including surfaces cleaned in UHV. Controlling the writing speed of the tip enabled the control over the number of monolayers of the polymer ink deposited on the surface from a single to tens of monolayers, with higher writing speeds generating thinner polymer nanostructures. Deposition onto silicon oxide-terminated substrates led to polymer chains standing upright on the surface, whereas deposition onto vacuum reconstructed silicon yielded polymer chains aligned along the surface.

Determination of the creep function using atomic force microscope

2020 ◽  
Vol 259 ◽  
pp. 126872
Author(s):  
Alexander P. Kren ◽  
Alexander S. Machikhin ◽  
Marat F. Bulatov
Keyword(s):  
Atomic Force Microscope ◽  
Creep Function ◽  
Atomic Force

Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope

1994 ◽  
Vol 33 (Part 1, No. 1B) ◽  
pp. 379-382 ◽  
Author(s):  
Yoshinobu Fukano ◽  
Takayuki Uchihashi ◽  
Takahiro Okusako ◽  
Ayumi Chayahara ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Time Evolution ◽  
Silicon Oxide ◽  
Oxide Surface ◽  
Atomic Force

Effect of Solvent and Dopant on Poly(3,4-ethylenedioxythiophene) Thin Films by Atomic Force Microscope Lithography

2008 ◽  
Vol 8 (9) ◽  
pp. 4757-4760 ◽  
Author(s):  
Yong-il Kim ◽  
Hyunsook Kim ◽  
Haiwon Lee
Keyword(s):  
Thin Films ◽  
Conducting Polymers ◽  
Atomic Force Microscope ◽  
Organic Solvents ◽  
Silicon Surface ◽  
Silicon Oxide ◽  
Organic Thin Films ◽  
Effect Of Solvent ◽  
Aspect Ratios ◽  
Atomic Force

AMF anodization lithography was performed on organic thin films with conducting polymers which is poly(3,4-ethylenedioxythiophene). The conductivity of PEDOT thin films was changed by different dopants and organic solvents. Two different dopants are poly(4-styrenesulfonate) and di(2-ethylhexyl)-sulfosuccinate. Also, DMF and IPA were used to prepare the PEDOT thin films doped with PSS and DEHS on silicon surface. The conductivities of these PEDOT variants were compared by obtaining their I–V curves between tip and thin films using AFM. Silicon oxide nanopatterns with higher aspect ratios can be obtained from the films with higher conductivity.

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