Development of an ultrasonic wave emission system based on multimedia database in a smart farm

Author(s):  
Shin-Hyeong Choi ◽  
Min-Sik Ghil ◽  
Hyung-Jin Mun



Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).



1999 ◽  
Vol 11 (1) ◽  
pp. 117-135
Author(s):  
P. Dineva ◽  
D. Gross ◽  
T. Rangelov


1983 ◽  
Vol 44 (C9) ◽  
pp. C9-337-C9-340 ◽  
Author(s):  
R. L. Smith ◽  
W. N. Reynolds ◽  
S. Perring


2020 ◽  
pp. 1-12
Author(s):  
Zhang Caiqian ◽  
Zhang Xincheng

The existing stand-alone multimedia machines and online multimedia machines in the market have certain deficiencies, so they cannot meet the actual needs. Based on this, this research combines the actual needs to design and implement a multi-media system based on the Internet of Things and cloud service platform. Moreover, through in-depth research on the MQTT protocol, this study proposes a message encryption verification scheme for the MQTT protocol, which can solve the problem of low message security in the Internet of Things communication to a certain extent. In addition, through research on the fusion technology of the Internet of Things and artificial intelligence, this research designs scheme to provide a LightGBM intelligent prediction module interface, MQTT message middleware, device management system, intelligent prediction and push interface for the cloud platform. Finally, this research completes the design and implementation of the cloud platform and tests the function and performance of the built multimedia system database. The research results show that the multimedia database constructed in this paper has good performance.



PIERS Online ◽  
2010 ◽  
Vol 6 (7) ◽  
pp. 636-639
Author(s):  
Toshiyuki Nakamiya ◽  
Fumiaki Mitsugi ◽  
Shota Suyama ◽  
Tomoaki Ikegami ◽  
Yoshito Sonoda ◽  
...  


Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.



Author(s):  
Thierry Parrassin ◽  
Sylvain Dudit ◽  
Michel Vallet ◽  
Antoine Reverdy ◽  
Hervé Deslandes

Abstract By adding a transmission grating into the optical path of our photon emission system and after calibration, we have completed several failure analysis case studies. In some cases, additional information on the emission sites is provided, as well as understanding of the behavior of transistors that are associated to the fail site. The main application of the setup is used for finding and differentiating easily related emission spots without advance knowledge in light emission mechanisms in integrated circuits.



2020 ◽  
Vol 59 (10) ◽  
pp. 105004
Author(s):  
Yoshihiko Saiwai ◽  
Takanari Kashiwagi ◽  
Kurama Nakade ◽  
Manabu Tsujimoto ◽  
Hidetoshi Minami ◽  
...  


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