Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach

2018 ◽  
Vol 61 (11) ◽  
Author(s):  
Xiaowei Li ◽  
Guihai Yan ◽  
Jing Ye ◽  
Ying Wang
Electronics ◽  
2021 ◽  
Vol 10 (10) ◽  
pp. 1167
Author(s):  
Kaiyue Zhou ◽  
Jia Li ◽  
Weibing Wang ◽  
Dapeng Chen

To improve the reliability and yield of thermopile infrared detectors, a self-test, self-calibration and self-repair methodology is proposed in this paper. A novel micro-electro-mechanical system (MEMS) infrared thermopile detector structure is designed in this method with a heating resistor building on the center of the membrane. The heating resistor is used as the stimuli of the sensing element on chip to achieve a self-test, and the responsivity related with ambient temperature can be calibrated by the equivalent model between electrical stimuli and physical stimuli. Furthermore, a fault tolerance mechanism is also proposed to localize the fault and repair the detector if the detector fails the test. The simulation results with faults simulated by the Monte Carlo stochastic model show that the proposed scheme is an effective solution to improve the yield of the MEMS thermopile infrared detector.


2007 ◽  
Vol 7 (9) ◽  
pp. 1225-1232 ◽  
Author(s):  
Andrew Mason ◽  
Abhijeet V. Chavan ◽  
Kensall D. Wise

Author(s):  
Hodjatollah Hamidi

The Algorithm-Based Fault Tolerance (ABFT) approach transforms a system that does not tolerate a specific type of faults, called the fault-intolerant system, to a system that provides a specific level of fault tolerance, namely recovery. The ABFT philosophy leads directly to a model from which error correction can be developed. By employing an ABFT scheme with effective convolutional code, the design allows high throughput as well as high fault coverage. The ABFT techniques that detect errors rely on the comparison of parity values computed in two ways. The parallel processing of input parity values produce output parity values comparable with parity values regenerated from the original processed outputs and can apply convolutional codes for the redundancy. This method is a new approach to concurrent error correction in fault-tolerant computing systems. This chapter proposes a novel computing paradigm to provide fault tolerance for numerical algorithms. The authors also present, implement, and evaluate early detection in ABFT.


2003 ◽  
Vol 38 (2) ◽  
pp. 263-273 ◽  
Author(s):  
B. Provost ◽  
E. Sanchez-Sinencio
Keyword(s):  

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