Scanning electron microscope in-situ investigation of fracture behavior in 96.5Sn3.5Ag lead-free solder

2005 ◽  
Vol 34 (10) ◽  
pp. 1324-1335 ◽  
Author(s):  
Ying Ding ◽  
Chunqing Wang ◽  
Mingyu Li
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Fracture Behavior ◽  
Lead Free ◽  
Lead Free Solder ◽  
In Situ Investigation ◽  
Free Solder ◽  
Scanning Electron

Intermetallic Study on the Modified Sn-3.5Ag-1.0Cu-1.0Zn Lead Free Solder

2016 ◽  
Vol 857 ◽  
pp. 3-7 ◽  
Author(s):  
Ramani Mayappan ◽  
Nur Nadiah Zainal Abidin ◽  
Noor Asikin Ab Ghani ◽  
Iziana Yahya ◽  
Norlin Shuhaime
Keyword(s):  
Electron Microscope ◽  
Powder Metallurgy ◽  
Joint Strength ◽  
Lead Free ◽  
Environmental Concerns ◽  
Lead Free Solder ◽  
Free Solder ◽  
Lead Free Solders ◽  
Powder Metallurgy Route ◽  
Scanning Electron

Due to environmental concerns, lead-free solders were introduced to replace the lead-based solders in microelectronics devices technology. Although there are many lead-free solders available, the Sn-Ag-Cu solders are considered the best replacement due to their good wettability and joint strength. Although the Sn-Ag-Cu solders are accepted widely, but there are still some room for improvement. In this study, 1wt% Zn, which can be considered high percentage for a dopant, was added into the solder via powder metallurgy route. The effects of adding this dopant into the Sn-3.5Ag-1.0Cu solder on the interface intermetallic and thickness were investigated. The intermetallics phases formed were observed under Scanning Electron Microscope (SEM) and their thicknesses were measured. The SEM results showed the presence of Cu6Sn5, Cu3Sn and (Cu,Zn)6Sn5 intermetallics. It can be concluded that Zn behaved as retarding agent and significantly retarded the growth of Cu-Sn intermetallics.

scholarly journals In situ investigation of production processes in a large chamber scanning electron microscope

2018 ◽  
Vol 193 ◽  
pp. 151-158 ◽  
Author(s):  
A. Aretz ◽  
L. Ehle ◽  
A. Haeusler ◽  
K. Bobzin ◽  
M. Öte ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Production Processes ◽  
In Situ Investigation ◽  
Scanning Electron
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