Non-thermal Microbial Inactivation of Honey Raspberry Wine Through the Application of High-Voltage Electrospray Technology

Author(s):  
Yuchuan Wang ◽  
Zili Hu ◽  
Bo Wang ◽  
Junying Liao ◽  
Min Zhang
2020 ◽  
Vol 13 (10) ◽  
pp. 1688-1702
Author(s):  
Lei Xu ◽  
Ximena Yepez ◽  
Bruce Applegate ◽  
Kevin M Keener ◽  
Bernard Tao ◽  
...  

Author(s):  
Elsara Krysti Simarmata ◽  
Ika Novia Anggraini ◽  
Novalio Daratha ◽  
Afriyastuti Herawati ◽  
Yuli Rodiah

ABSTRACTPackaged beverages have become a product that is very much on the market both internationally and nationally. In the process of making packaged beverages, in order to last longer the microbes in the drink must first be inactivated in order for the drink to last longer, the microbial inactivation process in the drink is called pasteurization. Convernsional pasteurization is done by heating the drink to be in production. But the high temperature of the drink can change the taste, color, and even nutrition of the drink. This is underpinning the non-thermal pasteurization process by using high voltage impulses (Pulsed Electric Field,PEF). PEF is a technology that utilizes high voltage DC to produce a field between two electrodes. Pateurization occurs when between electrodes there is milk that is flowed with high voltage DC. High voltage generation is performed using flyback transformers with voltage output up to 30 kV. In the pasteurization process given 6 voltage variations namely 5, 10, 12,5, 15, 20, and 30 kV. Pasteurization results are then tested in fmipa microbiology laboratory to find out the success of the tools that have been made. In each voltage variation it is obtained that all treatments have reached pasteurized milk quality standards based on SNI where at 5kV voltage variation can inactivat microbes up to 83.33%, voltage variation of 10kV can inactivat microbes up to 94.5%, At a voltage variation of 12.5 kV can inactivae microbes up to 83.6%, 15kV voltage variation can inactivae microbes up to 88.8%, while voltage variation of 20 kV can inactivae microbes up to 84.2% and at voltage variation 30 kV can inactivae microbes up to 84.8%.Key Words: PEF, Flyback Transformer, ZVS Driver, Pasteurization.


2017 ◽  
Vol 10 (10) ◽  
pp. 1778-1791 ◽  
Author(s):  
Lei Xu ◽  
Allen L. Garner ◽  
Bernard Tao ◽  
Kevin M. Keener

Author(s):  
L. D. Ackerman ◽  
S. H. Y. Wei

Mature human dental enamel has presented investigators with several difficulties in ultramicrotomy of specimens for electron microscopy due to its high degree of mineralization. This study explores the possibility of combining ion-milling and high voltage electron microscopy as a means of circumventing the problems of ultramicrotomy.A longitudinal section of an extracted human third molar was ground to a thickness of about 30 um and polarized light micrographs were taken. The specimen was attached to a single hole grid and thinned by argon-ion bombardment at 15° incidence while rotating at 15 rpm. The beam current in each of two guns was 50 μA with an accelerating voltage of 4 kV. A 20 nm carbon coating was evaporated onto the specimen to prevent an electron charge from building up during electron microscopy.


Author(s):  
Lee D. Peachey ◽  
Clara Franzini-Armstrong

The effective study of biological tissues in thick slices of embedded material by high voltage electron microscopy (HVEM) requires highly selective staining of those structures to be visualized so that they are not hidden or obscured by other structures in the image. A tilt pair of micrographs with subsequent stereoscopic viewing can be an important aid in three-dimensional visualization of these images, once an appropriate stain has been found. The peroxidase reaction has been used for this purpose in visualizing the T-system (transverse tubular system) of frog skeletal muscle by HVEM (1). We have found infiltration with lanthanum hydroxide to be particularly useful for three-dimensional visualization of certain aspects of the structure of the T- system in skeletal muscles of the frog. Specifically, lanthanum more completely fills the lumen of the tubules and is denser than the peroxidase reaction product.


Author(s):  
L. E. Thomas ◽  
J. S. Lally ◽  
R. M. Fisher

In addition to improved penetration at high voltage, the characteristics of HVEM images of crystalline materials are changed markedly as a result of many-beam excitation effects. This leads to changes in optimum imaging conditions for dislocations, planar faults, precipitates and other features.Resolution - Because of longer focal lengths and correspondingly larger aberrations, the usual instrument resolution parameter, CS174 λ 374 changes by only a factor of 2 from 100 kV to 1 MV. Since 90% of this change occurs below 500 kV any improvement in “classical” resolution in the MVEM is insignificant. However, as is widely recognized, an improvement in resolution for “thick” specimens (i.e. more than 1000 Å) due to reduced chromatic aberration is very large.


Author(s):  
T. Mukai ◽  
T. E. Mitchell

Radiation-induced homogeneous precipitation in Ni-Be alloys was recently observed by high voltage electron microscopy. A coupling of interstitial flux with solute Be atoms is responsible for the precipitation. The present investigation further shows that precipitation is also induced at thin foil surfaces by electron irradiation under a high vacuum.


Author(s):  
J. S. Lally ◽  
R. Evans

One of the instrumental factors often limiting the resolution of the electron microscope is image defocussing due to changes in accelerating voltage or objective lens current. This factor is particularly important in high voltage electron microscopes both because of the higher voltages and lens currents required but also because of the inherently longer focal lengths, i.e. 6 mm in contrast to 1.5-2.2 mm for modern short focal length objectives.The usual practice in commercial electron microscopes is to design separately stabilized accelerating voltage and lens supplies. In this case chromatic aberration in the image is caused by the random and independent fluctuations of both the high voltage and objective lens current.


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