Position-sensitive detectors based on two-dimensional materials

Nano Research ◽  
2020 ◽  
Author(s):  
Wenhui Wang ◽  
Junpeng Lu ◽  
Zhenhua Ni
Keyword(s):  
Two Dimensional ◽  
Two Dimensional Materials ◽  
Position Sensitive ◽  
Position Sensitive Detectors

X-ray position-sensitive detectors

1986 ◽  
Vol 19 (3) ◽  
pp. 145-163 ◽  
Author(s):  
U. W. Arndt
Keyword(s):  
X Rays ◽  
Two Dimensional ◽  
Physical Processes ◽  
X Ray ◽  
General Terms ◽  
Position Sensitive ◽  
Position Sensitive Detectors

The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20 keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one- and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors.

Stress Measurements with a Two-Dimensional Real-Time System

1988 ◽  
Vol 32 ◽  
pp. 397-406 ◽  
Author(s):  
G.M. Borgonovi ◽  
C.P. Gazza
Keyword(s):  
Two Dimensional ◽  
Single Exposure ◽  
Time System ◽  
Real Time System ◽  
One Dimensional ◽  
Potential Source ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Exposure Technique

Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.

Large-area, two-dimensional position sensitive detectors

1979 ◽  
Vol 162 (1-3) ◽  
pp. 657-675 ◽  
Author(s):  
U. Lynen ◽  
H. Stelzer ◽  
A. Gobbi ◽  
H. Sann ◽  
A. Olmi
Keyword(s):  
Two Dimensional ◽  
Large Area ◽  
Position Sensitive ◽  
Position Sensitive Detectors

scholarly journals The finer things in X-ray diffraction data collection

1999 ◽  
Vol 55 (10) ◽  
pp. 1718-1725 ◽  
Author(s):  
J. W. Pflugrath
Keyword(s):  
Data Collection ◽  
Diffraction Data ◽  
Rotation Angle ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Software Suite ◽  
X Ray ◽  
Position Sensitive ◽  
X Ray Background ◽  
Position Sensitive Detectors

X-ray diffraction images from two-dimensional position-sensitive detectors can be characterized as thick or thin, depending on whether the rotation-angle increment per image is greater than or less than the crystal mosaicity, respectively. The expectations and consequences of the processing of thick and thin images in terms of spatial overlap, saturated pixels, X-ray background andI/σ(I) are discussed. Thed*TREKsoftware suite for processing diffraction images is briefly introduced, and results fromd*TREKare compared with those from another popular package.

Design of a Real-Time Two-Dimensional Residual Stress Analyzer

1986 ◽  
Vol 30 ◽  
pp. 523-526
Author(s):  
G. M. Borgonovi
Keyword(s):  
Residual Stress ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Detector Plane ◽  
Flat Detector ◽  
One Dimensional ◽  
X Ray ◽  
State Of Stress ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Measurements of residual stress by X-ray diffraction are usually carried out with diffractometers or with one-dimensional position sensitive detectors. The stress is determined from the displacement of the peak that results from intersecting a diffraction cone at high angle with the line scanned by the detector. If a two-dimensional flat detector is used, the intersection of the diffraction cone with the detector plane is a ring, or section of a ring, which is also slightly displaced by the stress. The suggestion has been made use a two-dimensional detector to determine the surface state of stress.

Linear, circular and two dimensional position sensitive detectors

1978 ◽  
Vol 152 (1) ◽  
pp. 191-194 ◽  
Author(s):  
A. Gabriel ◽  
F. Dauvergne ◽  
G. Rosenbaum
Keyword(s):  
Two Dimensional ◽  
Position Sensitive ◽  
Position Sensitive Detectors
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