Large-area, two-dimensional position sensitive detectors

1979 ◽  
Vol 162 (1-3) ◽  
pp. 657-675 ◽  
Author(s):  
U. Lynen ◽  
H. Stelzer ◽  
A. Gobbi ◽  
H. Sann ◽  
A. Olmi
Keyword(s):  
Two Dimensional ◽  
Large Area ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Detection Limit of Large Area Id Thin Film Position Sensitive Detectors Based in a-Si:H P.I.N. Diodes

1995 ◽  
Vol 377 ◽  
Author(s):  
R. Martins ◽  
G. Lavareda ◽  
F. Soares ◽  
E. Fortunato
Keyword(s):  
Thin Film ◽  
Experimental Data ◽  
Steady State ◽  
Detection Limit ◽  
Large Area ◽  
Position Sensitive ◽  
Position Sensitive Detectors

ABSTRACTThe aim of this work is to provide the basis for the interpretation of the steady state lateral photoeffect observed in p-i-n a-Si:H ID Thin Film Position Sensitive Detectors (ID TFPSD). The experimental data recorded in ID TFPSD devices with different performances are compared with the predicted curves and the obtained correlation's discussed.

X-ray position-sensitive detectors

1986 ◽  
Vol 19 (3) ◽  
pp. 145-163 ◽  
Author(s):  
U. W. Arndt
Keyword(s):  
X Rays ◽  
Two Dimensional ◽  
Physical Processes ◽  
X Ray ◽  
General Terms ◽  
Position Sensitive ◽  
Position Sensitive Detectors

The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20 keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one- and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors.

Stress Measurements with a Two-Dimensional Real-Time System

1988 ◽  
Vol 32 ◽  
pp. 397-406 ◽  
Author(s):  
G.M. Borgonovi ◽  
C.P. Gazza
Keyword(s):  
Two Dimensional ◽  
Single Exposure ◽  
Time System ◽  
Real Time System ◽  
One Dimensional ◽  
Potential Source ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Exposure Technique

Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.

Large Area Flexible Amorphous Silicon Position Sensitive Detectors

2000 ◽  
Vol 609 ◽  
Author(s):  
Elvira M.C. Fortunato ◽  
Donatello Brida ◽  
Isabel M.M. Ferreira ◽  
H. M.B. Åguas ◽  
Patrícia Nunes ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Spectral Response ◽  
Chemical Vapour ◽  
Open Circuit ◽  
Large Area ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Chemical Vapour Deposition Technique ◽  
Position Sensitive ◽  
Position Sensitive Detectors

ABSTRACTLarge area thin film position sensitive detectors based on amorphous silicon technology have been prepared on polyimide substrates using the conventional plasma enhanced chemical vapour deposition technique. The sensors have been characterised by spectral response, illuminated I-V characteristics and position detectability measurements. The obtained one dimensional position sensors with 5 mm wide and 60 mm long present a maximum spectral response at 600 nm, an open circuit voltage of 0.6 V and a position detectability with a correlation of 0.9989 associated to a standard deviation of 1×10−2, comparable to those ones produced on glass substrates. The surface of the sensors at each stage of fabrication was investigated by Atomic Force Microscopy.

scholarly journals The finer things in X-ray diffraction data collection

1999 ◽  
Vol 55 (10) ◽  
pp. 1718-1725 ◽  
Author(s):  
J. W. Pflugrath
Keyword(s):  
Data Collection ◽  
Diffraction Data ◽  
Rotation Angle ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Software Suite ◽  
X Ray ◽  
Position Sensitive ◽  
X Ray Background ◽  
Position Sensitive Detectors

X-ray diffraction images from two-dimensional position-sensitive detectors can be characterized as thick or thin, depending on whether the rotation-angle increment per image is greater than or less than the crystal mosaicity, respectively. The expectations and consequences of the processing of thick and thin images in terms of spatial overlap, saturated pixels, X-ray background andI/σ(I) are discussed. Thed*TREKsoftware suite for processing diffraction images is briefly introduced, and results fromd*TREKare compared with those from another popular package.

Production and characterization of large area flexible thin film position sensitive detectors

2001 ◽  
Vol 383 (1-2) ◽  
pp. 310-313 ◽  
Author(s):  
E. Fortunato ◽  
D. Brida ◽  
I. Ferreira ◽  
H. Águas ◽  
P. Nunes ◽  
...  
Keyword(s):  
Thin Film ◽  
Large Area ◽  
Position Sensitive ◽  
Position Sensitive Detectors
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