Love wave transference in piezomagnetic layered structure guided by an imperfect interface

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Suman Goyal ◽  
Sanjeev A. Sahu
Keyword(s):  
Layered Structure ◽  
Love Wave ◽  
Imperfect Interface

Theoretical and Experimental Identification of Love Wave Frequency Peaks in Layered Structure ZnO/Quartz SAW Device

2008 ◽  
Vol 8 (8) ◽  
pp. 1399-1403 ◽  
Author(s):  
Felicidade Moreira ◽  
Mohamed El Hakiki ◽  
Omar Elmazria ◽  
Frederic Sarry ◽  
Laurent Le Brizoual ◽  
...  
Keyword(s):  
Layered Structure ◽  
Love Wave ◽  
Wave Frequency ◽  
Experimental Identification

Love Wave Propagation in Prestressed Piezoelectric Layered Structure

2016 ◽  
Vol 08 (04) ◽  
pp. 1650045 ◽  
Author(s):  
Shishir Gupta ◽  
Abhijit Pramanik ◽  
Mostaid Ahmed ◽  
Arun Kumar Verma
Keyword(s):  
Wave Propagation ◽  
Initial Stress ◽  
Layered Structure ◽  
Love Wave ◽  
Love Waves ◽  
Piezoelectric Film ◽  
Elastic Substrate ◽  
Open Case ◽  
Piezoelectric Layered Structure ◽  
General Dispersion

In this paper, the effect of initial stress on the propagation of Love waves in a layered structure with a thin piezoelectric film bonded perfectly to an elastic substrate has been investigated. General dispersion equations, describing the properties of Love waves in both cases, electrically open case and electrically shorted case of the piezoelectric layer, have been obtained. The effects of inhomogeneity parameters in the substrate and the initial stress in both, the layer and the substrate on the phase velocity of Love waves, are analyzed and presented graphically. The analytical method and obtained results may find applications for designing the resonators and sensors.

Propagation Behaviors of SH Waves in Piezoelectric Layer/Elastic Cylinder with an Imperfect Interface

2012 ◽  
Vol 151 ◽  
pp. 130-134 ◽  
Author(s):  
Yan Hong Wang ◽  
Mei Li Wang ◽  
Jin Xi Liu
Keyword(s):  
Dispersion Equation ◽  
Layered Structure ◽  
Material Properties ◽  
Piezoelectric Layer ◽  
Elastic Cylinder ◽  
Imperfect Interface ◽  
Interface Conditions ◽  
Sh Waves ◽  
Numerical Examples ◽  
Basic Equations

The dispersion behaviors of SH waves are investigated propagating in a layered structure consisting of a piezoelectric layer and an elastic cylinder. The interface between the piezoelectric layer and the elastic cylinder is assumed to be imperfect bonding. The surface of the piezoelectric layer is assumed to be mechanically free and electrically shorted. The dispersion equation is derived by the basic equations, the boundary and the interface conditions. The numerical examples are provided to show the influences of the imperfect interface, the thickness ratios and the material properties of the piezoelectric on the dispersive characteristics.

Love wave propagation in piezoelectric layered structure with dissipation

Ultrasonics ◽  
2009 ◽  
Vol 49 (2) ◽  
pp. 281-286 ◽  
Author(s):  
Jianke Du ◽  
Kai Xian ◽  
Ji Wang ◽  
Yook-Kong Yong
Keyword(s):  
Wave Propagation ◽  
Layered Structure ◽  
Love Wave ◽  
Piezoelectric Layered Structure

In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

1992 ◽  
Vol 50 (1) ◽  
pp. 256-257
Author(s):  
Tai D. Nguyen ◽  
Ronald Gronsky ◽  
Jeffrey B. Kortright
Keyword(s):  
Layered Structure ◽  
Driving Force ◽  
High Energy ◽  
Superior Performance ◽  
In Situ Tem ◽  
Rayleigh Instability ◽  
Practical Applications ◽  
Transmission Electron ◽  
Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

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