Liquid phase epitaxy of gallium arsenide on zinc selenide

1972 ◽  
Vol 15 (3) ◽  
pp. 204-210 ◽  
Author(s):  
J.W. Balch ◽  
W.W. Anderson
1993 ◽  
Vol 312 ◽  
Author(s):  
Werner Möhling ◽  
H. Weishart ◽  
E. Bauser

AbstractDislocations in GaAs are analysed by X-ray topography in order to relate their nature to their efficiency in generating growth steps. The analysis is mainly based on comparing double crystal back reflection images of the defects to calculated misorientations of the crystal surface which are caused at the outcrop. All types of dislocations are equally effective provided their Burgers vector has a component normal to the growth interface. Concentric growth step patterns, which develop in varying numbers on different samples are not caused by substrate dislocations.


2017 ◽  
Vol 51 (11) ◽  
pp. 1485-1489
Author(s):  
A. V. Murel ◽  
V. B. Shmagin ◽  
V. L. Krukov ◽  
S. S. Strelchenko ◽  
E. A. Surovegina ◽  
...  

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