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Author(s):  
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Eisuke Tokumitsu ◽  
Hiroshi Ishiwara
Keyword(s):  
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Yongzhao Yao ◽  
Yukari Ishikawa ◽  
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Keyword(s):  
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High Electron Mobility Transistor ◽  
High Electron ◽  
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Optical Characterization ◽  
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Mohamed Mongi Ben Salem ◽  
Salah Saadaoui ◽  
Walf Chikhaoui ◽  
Christophe Gaquière ◽  
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Silicon Carbide ◽  
Electron Mobility ◽  
High Electron Mobility Transistor ◽  
Gate Length ◽  
High Electron ◽  
High Electron Mobility
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