Raman characterization of SiNx deposition on undoped Al0.48In0.52As and n+ Ga0.47In0.53As layers for InP high electron mobility transistor applications
2000 ◽
Vol 18
(3)
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pp. 1638
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2009 ◽
Vol 24
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pp. 035013
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2020 ◽
Vol 257
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pp. 1900589
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2008 ◽
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pp. 787-790
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1995 ◽
Vol 150
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1995 ◽
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