Transmission electron microscopy observation of GaAs/Al0.3Ga0.7As T-shaped quantum well structure fabricated by glancing angle molecular beam epitaxy on GaAs(100) reverse-mesa etched substrates

Molecular Beam Epitaxy ◽

Quantum Well ◽

Molecular Beam ◽

Microscopy Observation ◽

Transmission Electron ◽

Glancing Angle

Transmission electron microscopy observation of crystal twinning in periodically inverted AlGaAs grown by low-temperature molecular beam epitaxy

Japanese Journal of Applied Physics ◽

10.7567/jjap.57.100306 ◽

2018 ◽

Vol 57 (10) ◽

pp. 100306

Author(s):

Tae Woong Kim ◽

Koji Amazutsumi ◽

Tomonori Matsushita ◽

Takashi Kondo

Keyword(s):

Electron Microscopy ◽

Molecular Beam Epitaxy ◽

Low Temperature ◽

Molecular Beam ◽

Microscopy Observation ◽

Transmission Electron ◽

Crystal Twinning

Reflection high-energy electron diffraction/transmission electron microscopy observation of growth of InAs on GaAs (110) by molecular beam epitaxy

Journal of Crystal Growth ◽

10.1016/0022-0248(93)90277-4 ◽

1993 ◽

Vol 132 (1-2) ◽

pp. 331-334 ◽

Cited By ~ 12

Author(s):

X. Zhang ◽

D.W. Pashley ◽

J.H. Neave ◽

P.N. Fawcett ◽

J. Zhang ◽

...

Keyword(s):

Electron Microscopy ◽

Molecular Beam Epitaxy ◽

Electron Diffraction ◽

Molecular Beam ◽

High Energy ◽

High Energy Electron ◽

Microscopy Observation ◽

In Situ Transmission Electron Microscopy Observation of Single Crystallization of Filled Aluminum Interconnection

Japanese Journal of Applied Physics ◽

10.1143/jjap.34.l1260 ◽

1995 ◽

Vol 34 (Part 2, No. 10A) ◽

pp. L1260-L1262 ◽

Cited By ~ 3

Author(s):

Jun-ichi Wada ◽

Hiroshi Toyoda ◽

Hisashi Kaneko ◽

Nobuo Hayasaka ◽

Hidehiro Yasuda ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Observation ◽

Transmission Electron Microscopy Observation of Microstructure of Plasma-Sprayed Nanostructured Zirconia Coating

CrossRef Listing of Deleted DOIs ◽

10.1361/105996303772082260 ◽

2003 ◽

Vol 12 (4) ◽

pp. 523-529 ◽

Cited By ~ 5

Author(s):

Huang Chen ◽

Chuanxian Ding

Keyword(s):

Electron Microscopy ◽

Zirconia Coating ◽

Microscopy Observation ◽

Transmission Electron ◽

Plasma Sprayed

Transmission Electron Microscopy Observation of Reaction in Nanometer-scaled Au and Si Binary System

Japanese Journal of Applied Physics ◽

10.1143/jjap.43.850 ◽

2004 ◽

Vol 43 (2) ◽

pp. 850-854

Author(s):

Takashi Ishiguro ◽

Takahiro Shinbo ◽

Junichi Shimanuki

Keyword(s):

Electron Microscopy ◽

Binary System ◽

Microscopy Observation ◽

Etching technique for transmission electron microscopy observation of nanostructure of visible luminescent porous silicon

Applied Physics Letters ◽

10.1063/1.109673 ◽

1993 ◽

Vol 63 (10) ◽

pp. 1348-1350 ◽

Cited By ~ 13

Author(s):

O. Teschke ◽

M. C. Goncalves ◽

F. Galembeck

Keyword(s):

Electron Microscopy ◽

Porous Silicon ◽

Microscopy Observation ◽

Etching Technique ◽

Transmission electron microscopy observation of the ferroelastic phase transition in LEAD PHOSPHATE (Pb3(PO4)2)

Ecomaterials ◽

10.1016/b978-1-4832-8381-4.50207-9 ◽

1994 ◽

pp. 885-888

Author(s):

S. MORI ◽

N. YAMAMOTO ◽

Y. KOYAMA ◽

Y. UESU ◽

Y. YAMADA

Keyword(s):

Electron Microscopy ◽

Phase Transition ◽

Microscopy Observation ◽

Lead Phosphate ◽

Ferroelastic Phase Transition ◽

In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.6813 ◽

2012 ◽

Vol 12 (11) ◽

pp. 8741-8745

Author(s):

Yosuke Murakami ◽

Masashi Arita ◽

Kouichi Hamada ◽

Yasuo Takahashi

Keyword(s):

Electron Microscopy ◽

Microscopy Observation ◽

Thin Wires ◽

High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

Journal of Electron Microscopy ◽

10.1093/jmicro/50.6.541 ◽

2001 ◽

Vol 50 (6) ◽

pp. 541-544 ◽

Cited By ~ 7

Author(s):

J. Liu

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Observation ◽

Cross Sectional ◽

Transmission Electron ◽

The Cross ◽

Sectional Structure

Cross‐sectional transmission electron microscopy observation of Nb/AlOx‐Al/Nb Josephson junctions

Applied Physics Letters ◽

10.1063/1.104556 ◽

1991 ◽

Vol 58 (6) ◽

pp. 645-647 ◽

Cited By ~ 27

Author(s):

Takeshi Imamura ◽

Shinya Hasuo

Keyword(s):

Electron Microscopy ◽

Josephson Junctions ◽

Microscopy Observation ◽

Cross Sectional ◽