Low temperature electron trapping lifetimes and extrinsic photoconductivity in n-type silicon doped with shallow impurities
1961 ◽
Vol 22
◽
pp. 269-284
◽
Keyword(s):
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-67-Pr3-70
Keyword(s):
2000 ◽
Vol 338-342
◽
pp. 1619-1619
1985 ◽
Vol 55
(11)
◽
pp. 1188-1191
◽