A reflection high energy electron diffraction examination of the defect structure in GaAs(001) films grown by molecular beam epitaxy
Keyword(s):
1994 ◽
Vol 137
(1-2)
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pp. 187-194
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Keyword(s):
1996 ◽
Vol 35
(Part 2, No. 3B)
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pp. L366-L369
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Keyword(s):
1988 ◽
Vol 6
(2)
◽
pp. 749
◽
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