A comparative study of thin film transistors using rare earth oxides as gates

1987 ◽  
Vol 147 (1) ◽  
pp. 25-32 ◽  
Author(s):  
P. Singh ◽  
B. Baishya
Keyword(s):  
Thin Film ◽  
Rare Earth ◽  
Comparative Study ◽  
Thin Film Transistors ◽  
Rare Earth Oxides

A Comparative Study on Fluorination and Oxidation of Indium–Gallium–Zinc Oxide Thin-Film Transistors

2018 ◽  
Vol 39 (2) ◽  
pp. 196-199 ◽  
Author(s):  
Lei Lu ◽  
Zhihe Xia ◽  
Jiapeng Li ◽  
Zhuoqun Feng ◽  
Sisi Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Comparative Study ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Indium Gallium

Preparation of rare-earth thulium doped tin-oxide thin films and their applications in thin film transistors

2019 ◽  
Vol 493 ◽  
pp. 63-69 ◽  
Author(s):  
Jin-hua Ren ◽  
Yu-ting Huang ◽  
Kai-wen Li ◽  
Jie Shen ◽  
Wan-yu Zeng ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Rare Earth ◽  
Tin Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Films

Comparative study on extraction methods of threshold voltage for thin‐film transistors

2019 ◽  
Vol 27 (12) ◽  
pp. 816-821
Author(s):  
Ziheng Bai ◽  
Xuewen Shi ◽  
Jiawei Wang ◽  
Nianduan Lu ◽  
Xinlv Duan ◽  
...  
Keyword(s):  
Thin Film ◽  
Comparative Study ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Extraction Methods

Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics

2012 ◽  
Vol 52 (9-10) ◽  
pp. 2504-2507 ◽  
Author(s):  
Seul Ki Lee ◽  
Sung Il Hong ◽  
Yeon Ho Lee ◽  
Se Won Lee ◽  
Won Ju Cho ◽  
...  
Keyword(s):  
Thin Film ◽  
Comparative Study ◽  
Thin Film Transistors ◽  
Gate Dielectrics

Role of Rare Earth Ions in Anodic Gate Dielectrics for Indium-Zinc-Oxide Thin-Film Transistors

2012 ◽  
Vol 159 (5) ◽  
pp. H502-H506 ◽  
Author(s):  
Dongxiang Luo ◽  
Linfeng Lan ◽  
Miao Xu ◽  
Hua Xu ◽  
Min Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Rare Earth ◽  
Thin Film Transistors ◽  
Gate Dielectrics ◽  
Rare Earth Ions ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Indium Zinc Oxide

Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements

2012 ◽  
Vol 33 (4) ◽  
pp. 555-557 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Shahrukh Khan ◽  
Miltiadis Hatalis ◽  
Charalabos A. Dimitriadis
Keyword(s):  
Thin Film ◽  
Comparative Study ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements
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