X-ray, reflection high electron energy diffraction and X-ray photoelectron spectroscopy studies of InSe and γ-In2Se3 thin films grown by molecular beam deposition

1994 ◽  
Vol 237 (1-2) ◽  
pp. 291-296 ◽  
Author(s):  
L. Brahim-Otsmane ◽  
J.-Y. Emery ◽  
M. Eddrief
1999 ◽  
Vol 593 ◽  
Author(s):  
Oliver Goetzberger ◽  
Nobuaki Kojima ◽  
Aurangzeb Khan ◽  
Masafumi Yamaguchi

ABSTRACTStudies on the electrical conductivity of molecular beam deposited carbon films after annealing of the carbon films have been carried out. Detailed temperature dependence of conductivity on the as-deposited and on annealed samples has been investigated. The results were interpreted in terms of a model which includes a variable range hopping and strongly scattering metallic components. A correlation between annealing behavior of the electrical conductivity and the results of x-ray photoelectron spectroscopy and Raman spectroscopy is presented.


1998 ◽  
Vol 130-132 ◽  
pp. 651-657 ◽  
Author(s):  
Yuji Yoshida ◽  
Hiroshi Takiguchi ◽  
Takeshi Hanada ◽  
Nobutaka Tanigaki ◽  
Eun Mi Han ◽  
...  

1995 ◽  
Vol 34 (Part 1, No. 7B) ◽  
pp. 3884-3888 ◽  
Author(s):  
Takayoshi Hayashi ◽  
Tohru Maruno ◽  
Akira Yamashita ◽  
Stefan Fölsch ◽  
Hirohisa Kanbara ◽  
...  

2018 ◽  
Vol 10 ◽  
pp. 129-135 ◽  
Author(s):  
Nanan Li ◽  
Pengfei Zhu ◽  
Yang Chen ◽  
Xiulan Duan ◽  
Fapeng Yu

2000 ◽  
Vol 111-112 ◽  
pp. 99-103
Author(s):  
S Blumstengel ◽  
A Sassella ◽  
A Filippini ◽  
M Gurioli ◽  
W Porzio ◽  
...  

1990 ◽  
Vol 8 (6) ◽  
pp. 3934-3937 ◽  
Author(s):  
C. H. Hale ◽  
I. T. Muirhead ◽  
S. P. Fisher ◽  
J. S. Orr ◽  
J. G. H. Mathew ◽  
...  

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