In situ spectroscopic ellipsometry studies of interfaces of thin films deposited by PECVD
2014 ◽
Vol 141
(8)
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pp. 084708
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Keyword(s):
2019 ◽
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pp. 400-405
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Vol 85
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pp. 527-533
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Vol 198-200
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pp. 883-886
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Vol 86
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pp. 185-189
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