Low resistivity aluminum nitride: carbon (AlN : C) films grown by metal organic chemical vapor deposition

1996 ◽  
Vol 26 (4-5) ◽  
pp. 223-226 ◽  
Author(s):  
K. Wongchotigul ◽  
N. Chen ◽  
D.P. Zhang ◽  
X. Tang ◽  
M.G. Spencer
1995 ◽  
Vol 395 ◽  
Author(s):  
K. Wongchotiqul ◽  
N. Chen ◽  
D. P. Zhang ◽  
X. Tang ◽  
M. G. Spencer

ABSTRACTLow resistivity single crystal aluminum nitride-carbon (AIN:C) films were grown by metal organic chemical vapor deposition (MOCVD). The growth system used ammonia (NH3), trimethylaluminum (TMA), hydrogen (H2), and propane (C3H8) precursors. Films produced with high partial pressure of propane during growth exhibited high conductivity. Van der Paw measurements indicated that the resistivity of the as grown films changed dramatically from 108 ohm-cm for unintentionally doped samples to less than .2 ohm-cm for partial pressures of propane greater than 0.5×10−3 torr. Reflection electron diffraction (RHEED) measurements performed "in situ" just after film growth indicated that the material is single crystal up to a propane partial pressure of 2.5×10−3 torr. P-n junctions of n-type 6H-SiC and p-type AIN:C were fabricated, blue emission (centered at 490nm) was observed from the heterojunction under forward bias.


1997 ◽  
Vol 82 (6) ◽  
pp. 2990-2995 ◽  
Author(s):  
C.-M. Zetterling ◽  
M. Östling ◽  
K. Wongchotigul ◽  
M. G. Spencer ◽  
X. Tang ◽  
...  

2016 ◽  
Vol 31 (8) ◽  
pp. 085003 ◽  
Author(s):  
Humberto M Foronda ◽  
Matthew A Laurent ◽  
Benjanim Yonkee ◽  
Stacia Keller ◽  
Steven P DenBaars ◽  
...  

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