Impact flash and debris cloud expansion of high-pure metal foils

1993 ◽  
Vol 14 (1-4) ◽  
pp. 797-808 ◽  
Author(s):  
K. Weber ◽  
V. Hohler ◽  
A.J. Stilp
Rare Metals ◽  
2011 ◽  
Vol 30 (S1) ◽  
pp. 331-334 ◽  
Author(s):  
Yeqing Zhao ◽  
Di Zhang ◽  
Yanbo Sun ◽  
Zengjie Wang ◽  
Ruixiao Zheng ◽  
...  
Keyword(s):  

Author(s):  
J. Bentley ◽  
E. A. Kenik

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.


Author(s):  
O.T. Woo ◽  
G.J.C. Carpenter

To study the influence of trace elements on the corrosion and hydrogen ingress in Zr-2.5 Nb pressure tube material, buttons of this alloy containing up to 0.83 at% Fe were made by arc-melting. The buttons were then annealed at 973 K for three days, furnace cooled, followed by ≈80% cold-rolling. The microstructure of cold-worked Zr-2.5 at% Nb-0.83 at% Fe (Fig. 1) contained both β-Zr and intermetallic precipitates in the α-Zr grains. The particles were 0.1 to 0.7 μm in size, with shapes ranging from spherical to ellipsoidal and often contained faults. β-Zr appeared either roughly spherical or as irregular elongated patches, often extending to several micrometres.The composition of the intermetallic particles seen in Fig. 1 was determined using Van Cappellen’s extrapolation technique for energy dispersive X-ray analysis of thin metal foils. The method was employed to avoid corrections for absorption and fluorescence via the Cliff-Lorimer equation: CA/CB = kAB · IA/IB, where CA and CB are the concentrations by weight of the elements A and B, and IA and IB are the X-ray intensities; kAB is a proportionality factor.


Author(s):  
S. Yegnasubramanian ◽  
V.C. Kannan ◽  
R. Dutto ◽  
P.J. Sakach

Recent developments in the fabrication of high performance GaAs devices impose crucial requirements of low resistance ohmic contacts with excellent contact properties such as, thermal stability, contact resistivity, contact depth, Schottky barrier height etc. The nature of the interface plays an important role in the stability of the contacts due to problems associated with interdiffusion and compound formation at the interface during device fabrication. Contacts of pure metal thin films on GaAs are not desirable due to the presence of the native oxide and surface defects at the interface. Nickel has been used as a contact metal on GaAs and has been found to be reactive at low temperatures. Formation Of Ni2 GaAs at 200 - 350C is reported and is found to grow epitaxially on (001) and on (111) GaAs, but is shown to be unstable at 450C. This paper reports the investigations carried out to understand the microstructure, nature of the interface and composition of sputter deposited and annealed (at different temperatures) Ni-Sb ohmic contacts on GaAs by TEM. Attempts were made to correlate the electrical properties of the films such as the sheet resistance and contact resistance, with the microstructure. The observations are corroborated by Scanning Auger Microprobe (SAM) investigations.


2006 ◽  
Vol 133 ◽  
pp. 511-514
Author(s):  
T. Matsuoka ◽  
A. Maksimchuk ◽  
T. Lin ◽  
O. V. Batishchev ◽  
A. A. Batishcheva ◽  
...  

1984 ◽  
Vol 45 (C2) ◽  
pp. C2-381-C2-386
Author(s):  
P. Doig ◽  
P. E.J. Flewitt
Keyword(s):  
X Ray ◽  

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