SURFACE STRUCTURE AFTER HIGH DOSE LIGHT ION BOMBARDMENT

Author(s):  
R. Behrisch ◽  
M. Risch ◽  
J. Roth ◽  
B.M.U. Scherzer
1985 ◽  
Vol 45 ◽  
Author(s):  
Marina Berti ◽  
A.V. Drigo ◽  
E. Gabilli ◽  
R. Lotti ◽  
G. Lulli ◽  
...  

ABSTRACTSome renarks about the mechanism for dynamic annealing during high dose rate P implantation of Si are reported. TEM observations and RBS channeling measurements show that the ion bombardment enhances the amorphous to crystalline transformation in the temperature range 200 ≤ T ≤ 600°C. It is found that the ratio between the observed recrystalli-zation velocity and the thermal SPE velocity decreases with increasing temperature. This indicates that a transition temperature must exist between the ion-assisted recrystallization regime and the ?lermal SPE regime. For the energy (100 keV) and the dose rate (60,uA/cm2) used in our experiments the transition temperature is about 700°C.


1988 ◽  
Vol 128 ◽  
Author(s):  
Z. A. Iskanderova ◽  
T. D. Radjabov ◽  
R. Yu. Leiderman ◽  
F. K. Tukfatullin

ABSTRACTThe mathematical model of a combined film deposition and and high dose ion implantation for coating formation has been developed. Calculations of concentration profiles of implanted element in the film and substrate depending on different parameters of the model have been carried out.


1997 ◽  
Vol 89 (1-2) ◽  
pp. 90-96 ◽  
Author(s):  
A.D. Pogrebnjak ◽  
S.M. Duvanov ◽  
A.D. Mikhaliov ◽  
V.I. Lavrentiev ◽  
V.V. Stayko ◽  
...  

2016 ◽  
Vol 80 (2) ◽  
pp. 156-160 ◽  
Author(s):  
N. N. Andrianova ◽  
A. M. Borisov ◽  
V. A. Kazakov ◽  
E. S. Mashkova ◽  
Yu. N. Palyanov ◽  
...  

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