scholarly journals Effects of 3d electron configurations on helium bubble formation and void swelling in concentrated solid-solution alloys

2019 ◽  
Vol 181 ◽  
pp. 519-529 ◽  
Author(s):  
Yanwen Zhang ◽  
Xing Wang ◽  
Yuri N. Osetsky ◽  
Yang Tong ◽  
Robert Harrison ◽  
...  
Materialia ◽  
2019 ◽  
Vol 5 ◽  
pp. 100183 ◽  
Author(s):  
Xing Wang ◽  
Ke Jin ◽  
Di Chen ◽  
Hongbin Bei ◽  
Yongqiang Wang ◽  
...  

2016 ◽  
Vol 474 ◽  
pp. 65-75 ◽  
Author(s):  
Chenyang Lu ◽  
Zheng Lu ◽  
Rui Xie ◽  
Chunming Liu ◽  
Lumin Wang

2015 ◽  
Vol 458 ◽  
pp. 216-223 ◽  
Author(s):  
O. El-Atwani ◽  
K. Hattar ◽  
J.A. Hinks ◽  
G. Greaves ◽  
S.S. Harilal ◽  
...  

Materials ◽  
2020 ◽  
Vol 13 (3) ◽  
pp. 794 ◽  
Author(s):  
Osman El Atwani ◽  
Kaan Unal ◽  
William Streit Cunningham ◽  
Saryu Fensin ◽  
Jonathan Hinks ◽  
...  

The use of ultrafine and nanocrystalline materials is a proposed pathway to mitigate irradiation damage in nuclear fusion components. Here, we examine the radiation tolerance of helium bubble formation in 85 nm (average grain size) nanocrystalline-equiaxed-grained tungsten and an ultrafine tungsten-TiC alloy under extreme low energy helium implantation at 1223 K via in-situ transmission electron microscope (TEM). Helium bubble damage evolution in terms of number density, size, and total volume contribution to grain matrices has been determined as a function of He+ implantation fluence. The outputs were compared to previously published results on severe plastically deformed (SPD) tungsten implanted under the same conditions. Large helium bubbles were formed on the grain boundaries and helium bubble damage evolution profiles are shown to differ among the different materials with less overall damage in the nanocrystalline tungsten. Compared to previous works, the results in this work indicate that the nanocrystalline tungsten should possess a fuzz formation threshold more than one order of magnitude higher than coarse-grained tungsten.


2020 ◽  
Author(s):  
Bingsheng Li ◽  
Zhen Yang ◽  
Shuai Xu ◽  
Kongfang Wei ◽  
Zhiguang Wang ◽  
...  

1984 ◽  
Vol 120 (2-3) ◽  
pp. 342-344 ◽  
Author(s):  
P.L. Lane ◽  
J.H. Evans ◽  
P.J. Goodhew

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