The role of oxygen and hydrogen partial pressures on structural and optical properties of ITO films deposited by reactive rf-magnetron sputtering

2007 ◽  
Vol 253 (14) ◽  
pp. 6068-6073 ◽  
Author(s):  
Rajesh Das ◽  
Koel Adhikary ◽  
Swati Ray
2013 ◽  
Vol 760-762 ◽  
pp. 776-779
Author(s):  
Shuang Li ◽  
Ming Chen ◽  
Feng Xiang Wang

In the present work, we investigated the effect of sputtering power on the structural and optical properties of ZnO films by radio frequency (rf) magnetron sputtering. Atom force microscopy (AFM), X-ray diffraction (XRD) and Prism coupling method were adopted to investigate the structure and optical properties of ZnO thin films deposited by sputtering powers in the range from 100~150W. XRD and AFM results shown that ZnO films with high c-axis preferred orientation crystalline structures have been successfully deposited under higher sputtering power condition. Moreover, it was also found that the indexes refractive of the films obtained by higher sputtering power are less than that of the bulk ZnO materials, which is closer to Crystal Refractive index.


2011 ◽  
Vol 406 (15-16) ◽  
pp. 3079-3082 ◽  
Author(s):  
Yijun Zhang ◽  
Jinliang Yan ◽  
Qingshan Li ◽  
Chong Qu ◽  
Liying Zhang ◽  
...  

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