Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

2012 ◽  
Vol 258 (24) ◽  
pp. 9751-9755 ◽  
Author(s):  
Fei Yang ◽  
Ling Xu ◽  
Rui Zhang ◽  
Lei Geng ◽  
Liang Tong ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Atomic Force Microscope ◽  
Direct Observation ◽  
Atomic Force

Friction measurements on phase-separated thin films with a modified atomic force microscope

Nature ◽  
1992 ◽  
Vol 359 (6391) ◽  
pp. 133-135 ◽  
Author(s):  
R. M. Overney ◽  
E. Meyer ◽  
J. Frommer ◽  
D. Brodbeck ◽  
R. Lüthi ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Friction Measurements

Direct Observation of Domain Structures in Triglycine Sulfate by Atomic Force Microscope

1994 ◽  
Vol 33 (Part 1, No. 3A) ◽  
pp. 1390-1393 ◽  
Author(s):  
Min-Kun Bae ◽  
Toshihisa Horiuchi ◽  
Kazuhiro Hara ◽  
Yoshihiro Ishibashi ◽  
Kazumi Matsushige
Keyword(s):  
Atomic Force Microscope ◽  
Direct Observation ◽  
Triglycine Sulfate ◽  
Domain Structures ◽  
Atomic Force

Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope

2004 ◽  
Vol 13 (5) ◽  
pp. 977-982 ◽  
Author(s):  
Q He ◽  
W M Huang ◽  
M H Hong ◽  
M J Wu ◽  
Y Q Fu ◽  
...  
Keyword(s):  
Thin Films ◽  
Shape Memory ◽  
Atomic Force Microscope ◽  
Atomic Force

Effect of Solvent and Dopant on Poly(3,4-ethylenedioxythiophene) Thin Films by Atomic Force Microscope Lithography

2008 ◽  
Vol 8 (9) ◽  
pp. 4757-4760 ◽  
Author(s):  
Yong-il Kim ◽  
Hyunsook Kim ◽  
Haiwon Lee
Keyword(s):  
Thin Films ◽  
Conducting Polymers ◽  
Atomic Force Microscope ◽  
Organic Solvents ◽  
Silicon Surface ◽  
Silicon Oxide ◽  
Organic Thin Films ◽  
Effect Of Solvent ◽  
Aspect Ratios ◽  
Atomic Force

AMF anodization lithography was performed on organic thin films with conducting polymers which is poly(3,4-ethylenedioxythiophene). The conductivity of PEDOT thin films was changed by different dopants and organic solvents. Two different dopants are poly(4-styrenesulfonate) and di(2-ethylhexyl)-sulfosuccinate. Also, DMF and IPA were used to prepare the PEDOT thin films doped with PSS and DEHS on silicon surface. The conductivities of these PEDOT variants were compared by obtaining their I–V curves between tip and thin films using AFM. Silicon oxide nanopatterns with higher aspect ratios can be obtained from the films with higher conductivity.

Direct Observation of Doping Sites in Temperature-Controlled, p-Doped P3HT Thin Films by Conducting Atomic Force Microscopy

2014 ◽  
Vol 26 (35) ◽  
pp. 6069-6073 ◽  
Author(s):  
Duc T. Duong ◽  
Hung Phan ◽  
David Hanifi ◽  
Pil Sung Jo ◽  
Thuc-Quyen Nguyen ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Temperature Controlled
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