Structural, morphological and optical properties of Cd doped ZnO film grown on a- and r-plane sapphire substrate by MOCVD

2014 ◽  
Vol 311 ◽  
pp. 648-658 ◽  
Author(s):  
A. Fouzri ◽  
M.A. Boukadhaba ◽  
A. Touré ◽  
N. Sakly ◽  
A. Bchetnia ◽  
...  
2008 ◽  
Vol 516 (6) ◽  
pp. 1137-1141 ◽  
Author(s):  
Chenghua Sui ◽  
Naibo Chen ◽  
Xiaojun Xu ◽  
Gaoyao Wei ◽  
Pinggen Cai ◽  
...  

2011 ◽  
Vol 14 (3-4) ◽  
pp. 257-260 ◽  
Author(s):  
Yue Zhao ◽  
Mingtao Zhou ◽  
Zhiyong Lv ◽  
Zhao Li ◽  
Jian Huang ◽  
...  

2014 ◽  
Vol 97 (11) ◽  
pp. 3549-3554 ◽  
Author(s):  
Ping Yang ◽  
Lin Deng ◽  
Liqiang Zhang ◽  
Haiying Yang

2010 ◽  
Vol 45 (9) ◽  
pp. 1046-1050 ◽  
Author(s):  
Yue Zhao ◽  
Zhao Li ◽  
Zhiyong Lv ◽  
Xiaoyan Liang ◽  
Jiahua Min ◽  
...  

2013 ◽  
Vol 22 (2) ◽  
pp. 024202 ◽  
Author(s):  
Xian-Wei Zhao ◽  
Xiao-Yong Gao ◽  
Xian-Mei Chen ◽  
Chao Chen ◽  
Meng-Ke Zhao

2013 ◽  
Vol 641-642 ◽  
pp. 547-550 ◽  
Author(s):  
Ying Xiang Yang ◽  
Hong Lin Tan ◽  
Cheng Lin Ni ◽  
Chao Xiang

Un-doped and (Cu, Al)-doped ZnO thin films were prepared by sol-gel spin coating technique on glass substrate. The effect of(Cu, Al)incorporation on the structural, morphological and optical properties of the Zinc oxide (ZnO)film was investigated by means of X-ray diffraction, scanning electron microscopy and UV-vis spectrophotometer. It has been found that the grain sizes, Optical band gap and the preferred orientation growth of (002) plane were decreased with increasing of (Cu, Al) dopants amount in ZnO films.


2017 ◽  
Vol 896 ◽  
pp. 40-43
Author(s):  
Li Na Wang ◽  
Dan Zhou ◽  
You Yu ◽  
Zhong Qi Luan ◽  
Bing Qu ◽  
...  

Because of the different melting point, it is difficult to doped Ag element in ZnO film. Ag dopant can adjust the properties of ZnO materials. In this paper, we deposited Ag doped ZnO film using two step vapour evaporation method on c-plane sapphire substrate. The SEM image shows that the doped film was composed of small grain which compact in order and the Ag microwires was dispersed on the surface. The EDX graph proves that the Ag was indeed in the film. The XRD pattern reveals that the doped film has prefer orientation along the c-axis with wurtzite structure and the dopants have not effect the crystal quality.


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