Thermally induced atomic and electronic structure evolution in nanostructured carbon film by in situ TEM/EELS analysis

2019 ◽  
Vol 498 ◽  
pp. 143831 ◽  
Author(s):  
Nan Jian ◽  
Peidong Xue ◽  
Dongfeng Diao
Keyword(s):  
Electronic Structure ◽  
Carbon Film ◽  
Structure Evolution ◽  
In Situ Tem ◽  
Nanostructured Carbon ◽  
Thermally Induced ◽  
Atomic And Electronic Structure

In situ study on the evolution of atomic and electronic structure of LaTiO3/SrTiO3 system

2022 ◽  
Vol 6 (1) ◽  
Author(s):  
Hawoong Hong ◽  
Jessica L. McChesney ◽  
Friederike Wrobel ◽  
Xi Yan ◽  
Yan Li ◽  
...  
Keyword(s):  
Electronic Structure ◽  
In Situ Study ◽  
Atomic And Electronic Structure

Formation of Hollow Zinc Oxide by Oxidation and Subsequent Thermal Treatment

2008 ◽  
Vol 135 ◽  
pp. 11-14 ◽  
Author(s):  
Jung Goo Lee ◽  
Ryusuke Nakamura ◽  
Daisuke Tokozakura ◽  
Hideo Nakajima ◽  
Hirotaro Mori ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Thermal Treatment ◽  
Oxide Layer ◽  
Room Temperature ◽  
Carbon Film ◽  
In Situ Tem ◽  
Zinc Vapor ◽  
Amorphous Carbon Film ◽  
Subsequent Thermal Treatment

The formation of hollow zinc oxide has been studied by oxidation and subsequent thermal treatment of nanometer-sized zinc particles using in-situ TEM. The zinc particles produced under UHV condition were exposed to air at room temperature for 0.6 ks, which resulted in the formation of oxide layer with thickness of 3 nm. Subsequent heating inside UHV chamber of TEM induced the evaporation of the inner zinc, which resulted in the formation of hollow zinc oxide. The produced hollow zinc oxide had the wurtzite structure. Based upon the vapor pressure of the inner zinc, it seems reasonable to consider that the internal zinc vapor leaks away through the interface between the oxide layer and the amorphous carbon film used as a supporting substrate.

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