Characteristics of a mixed-gas cluster ion beam for time-of-flight secondary ion mass spectrometry

Ion Beam ◽

Time Of Flight ◽

Mixed Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry

Scientific Reports ◽

10.1038/srep10000 ◽

2015 ◽

Vol 5 (1) ◽

Cited By ~ 4

Author(s):

Noritaka Masaki ◽

Itsuko Ishizaki ◽

Takahiro Hayasaka ◽

Gregory L. Fisher ◽

Noriaki Sanada ◽

...

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Three Dimensional ◽

Time Of Flight ◽

Dimensional Image ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Exploiting the Semidestructive Nature of Gas Cluster Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Imaging for Simultaneous Localization and Confident Lipid Annotations

Analytical Chemistry ◽

10.1021/acs.analchem.9b03763 ◽

2019 ◽

Vol 91 (23) ◽

pp. 15073-15080 ◽

Cited By ~ 6

Author(s):

Tina B. Angerer ◽

Dusan Velickovic ◽

Carrie D. Nicora ◽

Jennifer E. Kyle ◽

Daniel J. Graham ◽

...

Keyword(s):

Mass Spectrometry ◽

Mass Spectrometry Imaging ◽

Ion Beam ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling

10.1116/1.5024044 ◽

2018 ◽

Vol 36 (3) ◽

pp. 03E105

Author(s):

Michaeleen L. Pacholski ◽

Zhaohui Qu ◽

Wuye Ouyang ◽

Zhibo Zheng ◽

Rong Wang

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Latex Films ◽

Chemical Oscillation ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

Surface and Interface Analysis ◽

10.1002/sia.5518 ◽

2014 ◽

Vol 46 (12-13) ◽

pp. 1129-1132

Author(s):

Makiko Fujii ◽

Shunichirou Nakagawa ◽

Toshio Seki ◽

Takaaki Aoki ◽

Jiro Matsuo

Keyword(s):

Mass Spectrometry ◽

Quantitative Analysis ◽

Ion Beam ◽

Argon Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.6867 ◽

2014 ◽

Vol 28 (8) ◽

pp. 917-920 ◽

Cited By ~ 10

Author(s):

Makiko Fujii ◽

Shunichirou Nakagawa ◽

Kazuhiro Matsuda ◽

Naoki Man ◽

Toshio Seki ◽

...

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Detection Limits ◽

Argon Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Evaluation and Data Analysis of Biological Samples and Biomolecules by Means of Time-of-flight Secondary Ion Mass Spectrometry with Cluster Ion Beam

Vacuum and Surface Science ◽

10.1380/vss.61.458 ◽

2018 ◽

Vol 61 (7) ◽

pp. 458-462

Author(s):

Satoka AOYAGI

Keyword(s):

Mass Spectrometry ◽

Data Analysis ◽

Biological Samples ◽

Ion Beam ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Multiomics Imaging Using High-Energy Water Gas Cluster Ion Beam Secondary Ion Mass Spectrometry [(H2O)n-GCIB-SIMS] of Frozen-Hydrated Cells and Tissue

Analytical Chemistry ◽

10.1021/acs.analchem.0c05210 ◽

2021 ◽

Author(s):

Hua Tian ◽

Sadia Sheraz née Rabbani ◽

John C. Vickerman ◽

Nicholas Winograd

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

High Energy ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Water Gas ◽

Are cluster ion analysis beams good choices for hydrogen depth profiling using time-of-flight secondary ion mass spectrometry?

Surface and Interface Analysis ◽

10.1002/sia.3776 ◽

2011 ◽

Vol 44 (1) ◽

pp. 89-93 ◽

Cited By ~ 10

Author(s):

Zihua Zhu ◽

Vaithiyalingam Shutthanandan

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Secondary Ion ◽

Ion Analysis

Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.348 ◽

2013 ◽

Vol 56 (9) ◽

pp. 348-354 ◽

Cited By ~ 2

Author(s):

Takuya MIYAYAMA

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Ion Beam ◽

Argon Gas ◽

X Ray ◽

Practical Applications ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Comparison of the Spectra of LiCoO2, CoO, and Co3O4 by Time-of-Flight Secondary Ion Mass Spectrometry with Focused Ion Beam (FIB-TOF-SIMS)

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.122 ◽

2013 ◽

Vol 56 (4) ◽

pp. 122-124 ◽

Cited By ~ 2

Author(s):

Miwa OHNISHI ◽

Osamu MATSUOKA ◽

Hidenobu NOGI ◽

Tetsuo SAKAMOTO

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Ion Beam ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽