An improved algorithm of second order to construct consistent theories of equilibrium figures of rotating celestial bodies

Among the few parameters that describe the generalized space time metrics, astrometric techniques are essentially sensitive to the displacement of the apparent positions of celestial bodies. This includes the relativistic light deflection and aberration. The possibilities of small field and wide field astrometry in measuring these effects are described. The case of the second order aberration terms is considered with some detail from the theoretical point of view, both for stellar and planetary aberration. New results are presented in the latter case.A section is devoted to a description of the existing space astrometry projects among which Space Telescope and HIPPARCOS are approved but will not contribute significantly to relativistic studies. Several “second generation” projects exist that aim at 2 or 3 orders of magnitude improvement in precision. They would yield results on second order relativistic effects and may be used to determine masses of some single stars. However, the present state of engineering of space astrometric missions has permitted to identify several limitations of the present and future missions. They will not all be readily suppressed and one should be very careful in assessing now their potentialities. It seems however that interferometric techniques have more chance to reach the 10−4 and 10−5 arc second precision than the imaging methods.

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Symmetric Multistep Methods Revisited: II. Numerical Experiments

International Astronomical Union Colloquium ◽

10.1017/s0252921100031602 ◽

1999 ◽

Vol 173 ◽

pp. 309-314 ◽

Cited By ~ 3

Author(s):

T. Fukushima

Keyword(s):

Multistep Methods ◽

Computational Time ◽

Integration Time ◽

Implicit Methods ◽

Symmetric Methods ◽

Celestial Bodies ◽

The Stability ◽

Predictor Corrector ◽

Symmetric Multistep Methods ◽

Integration Errors

AbstractBy using the stability condition and general formulas developed by Fukushima (1998 = Paper I) we discovered that, just as in the case of the explicit symmetric multistep methods (Quinlan and Tremaine, 1990), when integrating orbital motions of celestial bodies, the implicit symmetric multistep methods used in the predictor-corrector manner lead to integration errors in position which grow linearly with the integration time if the stepsizes adopted are sufficiently small and if the number of corrections is sufficiently large, say two or three. We confirmed also that the symmetric methods (explicit or implicit) would produce the stepsize-dependent instabilities/resonances, which was discovered by A. Toomre in 1991 and confirmed by G.D. Quinlan for some high order explicit methods. Although the implicit methods require twice or more computational time for the same stepsize than the explicit symmetric ones do, they seem to be preferable since they reduce these undesirable features significantly.

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Disappearance Voltage Determinations Using a Convergent Beam

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064979 ◽

1971 ◽

Vol 29 ◽

pp. 184-185

Author(s):

W. L. Bell

Keyword(s):

Second Order ◽

Objective Method ◽

Uniform Thickness ◽

Rocking Curve ◽

Crystal Perfection ◽

Kikuchi Line ◽

Central Maximum ◽

Diffraction Patterns ◽

Convergent Beam ◽

Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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