X-ray reflectivity data analysis using Bayesian inference: the study of induced Pt magnetization in Pt/Co/Pt

It is well established that unique physiological information can be obtained by rapidly freezing cells in various functional states and analyzing the cell element content and distribution by electron probe x-ray microanalysis. (The other techniques of microanalysis that are amenable to imaging, such as electron energy loss spectroscopy, secondary ion mass spectroscopy, particle induced x-ray emission etc., are not addressed in this tutorial.) However, the usual processes of data acquisition are labor intensive and lengthy, requiring that x-ray counts be collected from individually selected regions of each cell in question and that data analysis be performed subsequent to data collection. A judicious combination of quantitative elemental maps and static raster probes adds not only an additional overall perception of what is occurring during a particular biological manipulation or event, but substantially increases data productivity. Recent advances in microcomputer instrumentation and software have made readily feasible the acquisition and processing of digital quantitative x-ray maps of one to several cells.

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Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

10.3403/30235354 ◽

2013 ◽

Keyword(s):

Thin Films ◽

Data Analysis ◽

Data Collection ◽

X Ray ◽

Interface Width ◽

Collection Data

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Estimating single-crystal elastic constants of polycrystalline β metastable titanium alloy: A Bayesian inference analysis based on high energy X-ray diffraction and micromechanical modeling

Acta Materialia ◽

10.1016/j.actamat.2021.116762 ◽

2021 ◽

pp. 116762

Author(s):

Ravi raj purohit PURUSHOTTAM RAJ PUROHIT ◽

Thiebaud RICHETON ◽

Stephane BERBENNI ◽

Lionel GERMAIN ◽

Nathalie GEY ◽

...

Keyword(s):

Titanium Alloy ◽

Bayesian Inference ◽

Single Crystal ◽

Elastic Constants ◽

High Energy ◽

Bayesian Inference Analysis ◽

Micromechanical Modeling ◽

X Ray Diffraction ◽

X Ray

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XRD Data Visualization, Processing and Analysis with d1Dplot and d2Dplot Software Packages

Proceedings ◽

10.3390/proceedings2020062009 ◽

2020 ◽

Vol 62 (1) ◽

pp. 9

Author(s):

Oriol Vallcorba ◽

Jordi Rius

Keyword(s):

Data Analysis ◽

Data Visualization ◽

X Ray Diffraction ◽

Specific Data ◽

X Ray ◽

Software Packages ◽

Compound Database ◽

Synchrotron Light ◽

User Friendly ◽

Transformation Processes

The d1Dplot and d2Dplot computer programs have been developed as user-friendly tools for the inspection and processing of 1D and 2D X-ray diffraction (XRD) data, respectively. d1Dplot provides general tools for data processing and includes the ability to generate comprehensive 2D plots of multiple patterns to easily follow transformation processes. d2Dplot is a full package for 2D XRD data. Besides general processing tools, it includes specific data analysis routines for the application of the through-the-substrate methodology [Rius et al. IUCrJ 2015, 2, 452–463]. Both programs allow the creation of a user compound database for the identification of crystalline phases. The software can be downloaded from the ALBA Synchrotron Light Source website and can be used free of charge for non-commercial and academic purposes.

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Impact of x-ray dose on track formation and data analysis for CR-39-based proton diagnostics

Review of Scientific Instruments ◽

10.1063/1.4938161 ◽

2015 ◽

Vol 86 (12) ◽

pp. 123511 ◽

Cited By ~ 1

Author(s):

H. G. Rinderknecht ◽

J. Rojas-Herrera ◽

A. B. Zylstra ◽

J. A. Frenje ◽

M. Gatu Johnson ◽

...

Keyword(s):

Data Analysis ◽

X Ray ◽

Track Formation

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Structural Properties Of Co/Re Superlattices

MRS Proceedings ◽

10.1557/proc-238-671 ◽

1991 ◽

Vol 238 ◽

Cited By ~ 7

Author(s):

Y. Huai ◽

R. W. Cochrane ◽

Y. Shi ◽

H. E. Fischer ◽

M. Sutton

Keyword(s):

Structural Disorder ◽

Multilayer Films ◽

Film Plane ◽

X Ray Diffraction ◽

X Ray ◽

Bilayer Films ◽

Out Of Plane ◽

Reflectivity Data ◽

Sharp Interfaces ◽

Good Agreement

ABSTRACTThe structures of equal-thickness Co/Re multilayer films and several Co/Re bilayer films have been investigated by X-ray diffraction at low and high angles. Analysis of low-angle reflectivity data from bilayer films indicates that interfacial intermixing is limited to three monolayers and that the two interfacial configurations are different. The high-angle X-ray diffraction data show that multilayer films have coherent interfaces and a highly textured structure with hep [002] orientations normal to the film plane for periods 21 Å ≤ Λ ≤220 Å. Detailed structures have been determined by fitting the X-ray spectra to calculated ones using a trapezoidal model. The results indicate that samples with 42 Å≤ Λ ≤220 Å have relatively sharp interfaces, in good agreement with the bilayer results. In addition, an out-of-plane expansion of the Co (002) layer is observed in samples with large Λ and results from structural disorder leading to a reduced atomic density. For Λ <21 Å the interfaces arise from the rougher surfaces of the deposited layers.

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