Characterisation and quantification of membrane surface properties using atomic force microscopy: A comprehensive review

Desalination ◽  
2015 ◽  
Vol 356 ◽  
pp. 149-164 ◽  
Author(s):  
Daniel Johnson ◽  
Nidal Hilal
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Membrane Surface ◽  
Comprehensive Review ◽  
Force Microscopy ◽  
Atomic Force

Mechanical Properties of Membrane Surface of Cultured Astrocyte Revealed by Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3711-3716 ◽  
Author(s):  
Hatsuki Shiga ◽  
Yukako Yamane ◽  
Etsuro Ito ◽  
Kazuhiro Abe ◽  
Kazushige Kawabata ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Membrane Surface ◽  
Force Microscopy ◽  
Atomic Force

Image enhancement of polyethersulfone ultrafiltration membrane surface structure for atomic force microscopy

1992 ◽  
Vol 46 (1) ◽  
pp. 167-178 ◽  
Author(s):  
A. K. Fritzsche ◽  
A. R. Arevalo ◽  
M. D. Moore ◽  
C. J. Weber ◽  
V. B. Elings ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Image Enhancement ◽  
Membrane Surface ◽  
Ultrafiltration Membrane ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals An investigation of surface properties, local elastic modulus and interaction with simulated pulmonary surfactant of surface modified inhalable voriconazole dry powders using atomic force microscopy

RSC Advances ◽  
2016 ◽  
Vol 6 (31) ◽  
pp. 25789-25798 ◽  
Author(s):  
Sumit Arora ◽  
Michael Kappl ◽  
Mehra Haghi ◽  
Paul M. Young ◽  
Daniela Traini ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Surface Properties ◽  
Pulmonary Surfactant ◽  
Dry Powders ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Modified ◽  
Spray Dried

l-Leucine modified voriconazole spray dried micropartcles.

Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials

2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Application Rate ◽  
Critical Parameters ◽  
Nanomechanical Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Microscopy Techniques ◽  
Scratch Tests

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.

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