scholarly journals Heterogeneous Nanoscale Morphology in Cross-Sections of Bulk Heterojunction Polymer Solar Cells Visualized by Analytical Electron Microscopy

2012 ◽  
Vol 31 ◽  
pp. 46-59 ◽  
Author(s):  
Harald Flügge ◽  
Martin Pfannmöller ◽  
Gerd Benner ◽  
Irene Wacker ◽  
Hans Schmidt ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solar Cells ◽  
Cross Sections ◽  
Bulk Heterojunction ◽  
Polymer Solar Cells ◽  
Analytical Electron Microscopy ◽  
Analytical Electron ◽  
Nanoscale Morphology

Visualizing a Homogeneous Blend in Bulk Heterojunction Polymer Solar Cells by Analytical Electron Microscopy

Nano Letters ◽  
2011 ◽  
Vol 11 (8) ◽  
pp. 3099-3107 ◽  
Author(s):  
Martin Pfannmöller ◽  
Harald Flügge ◽  
Gerd Benner ◽  
Irene Wacker ◽  
Christoph Sommer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solar Cells ◽  
Bulk Heterojunction ◽  
Polymer Solar Cells ◽  
Analytical Electron Microscopy ◽  
Analytical Electron

The Influence of Different Brass Pretreatments on Rubber-Metal Bonding: Investigated by Analytical Electron Microscopy

1993 ◽  
Vol 66 (5) ◽  
pp. 837-848 ◽  
Author(s):  
T. Kretzschmar ◽  
K. Hummel ◽  
F. Hofer
Keyword(s):  
Electron Microscopy ◽  
Cross Sections ◽  
Analytical Electron Microscopy ◽  
Chemical Compositions ◽  
Surface Layers ◽  
Thin Foils ◽  
Fecl3 Solution ◽  
Analytical Electron ◽  
Crystallographic Structures ◽  
Preparation Techniques

Abstract Brass samples (thin foils or plates) were pretreated either by etching with aqueous HC1 or by rubbing with emery cloth. A mixture of cis-l,4-polybutadiene with sulfur and N,N-dicyclohexyl-2-benzothiazylsulfenamide was vulcanized in contact with the brass surfaces. The bonding layers were investigated by analytical electron microscopy (AEM). Two preparation techniques for AEM were used, namely cryo-ultramicrotomy to obtain cross sections (applied to foils), or separating ultrathin surface layers with an aqueous HCl/FeCl3 solution (applied to plates). Across the bonding layers, various crystallographic structures and chemical compositions were found, depending on the pretreatment of the brass.

K-shell cross sections for analytical electron microscopy

1984 ◽  
Vol 42 ◽  
pp. 572-573
Author(s):  
Nestor J. Zaluzec
Keyword(s):  
Electron Microscopy ◽  
Cross Sections ◽  
Analytical Electron Microscopy ◽  
Relativistic Effects ◽  
Bethe Equation ◽  
Ionization Cross ◽  
X Ray ◽  
Analytical Electron ◽  
Ionization Cross Sections

There has during the last few years been a renewed interest in the calculation of ionization cross-sections for use in AEM-based x-ray analysis, due to the fact that modern AEM's can operate up to accelerating potentials of 400 kV. In this regime relativistic effects are considerable and the extrapolation of the “accepted” microprobe-based formulae to these levels is questionable and the relativistic Bethe equation is the most appropriate formulation.

On the use of ionization cross sections in analytical electron microscopy

1984 ◽  
Vol 136 (2) ◽  
pp. 209-218 ◽  
Author(s):  
D. B. Williams ◽  
D. E. Newbury ◽  
J. I. Goldstein ◽  
C. E. Fiori
Keyword(s):  
Electron Microscopy ◽  
Cross Sections ◽  
Analytical Electron Microscopy ◽  
Ionization Cross ◽  
Analytical Electron ◽  
Ionization Cross Sections

Quantitative Determination of van Gogh's Painting Grounds Using SEM/EDX

2010 ◽  
Vol 17 (5) ◽  
pp. 686-690 ◽  
Author(s):  
Ralph Haswell ◽  
Leslie Carlyle ◽  
Kees T.J. Mensch
Keyword(s):  
Electron Microscopy ◽  
Cross Sections ◽  
Analytical Electron Microscopy ◽  
Qualitative Approach ◽  
Absolute Amount ◽  
Van Gogh ◽  
X Ray ◽  
Analytical Electron ◽  
Materials Used

AbstractWe have investigated the potential of utilizing analytical electron microscopy to quantitatively examine the grounds used by van Gogh and, in particular, the absolute amount of extender employed. To determine the accuracy that can be achieved, a series of oil paint reconstructions were used as standards. The proportion of extender was measured using scanning electron microscopy and energy dispersive X-ray spectroscopy, and a relative error of 10% or better was achieved. The same method was then used to determine the ground composition of real samples from van Gogh paintings. The results obtained in this work are part of a more quantitative method of comparing and classifying paint cross sections, which will supplement the more traditional qualitative approach. The information obtained from this study is being used to add to our knowledge of the methods and materials used by van Gogh, which is helping in the reconstruction of van Gogh's oeuvre and attribution.

scholarly journals Visualizing morphological principles for efficient photocurrent generation in organic non-fullerene acceptor blends

2020 ◽  
Vol 13 (4) ◽  
pp. 1259-1268 ◽  
Author(s):  
Wolfgang Köntges ◽  
Pavlo Perkhun ◽  
Jochen Kammerer ◽  
Riva Alkarsifi ◽  
Uli Würfel ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solar Cells ◽  
Organic Solar Cells ◽  
Analytical Electron Microscopy ◽  
Photocurrent Generation ◽  
Analytical Electron

Analytical electron microscopy reveals local molecular arrangements of PBDB-T:ITIC determining performance of current organic solar cells.

Electron Beam Damage of Biomolecules Assessed by Energy Loss Spectroscopy

1978 ◽  
Vol 36 (3) ◽  
pp. 61-69
Author(s):  
M. Isaacson ◽  
M.L. Collins ◽  
M. Listvan
Keyword(s):  
Electron Microscopy ◽  
Radiation Damage ◽  
Structural Integrity ◽  
Analytical Electron Microscopy ◽  
High Dose ◽  
Dose Rates ◽  
Special Cases ◽  
Analytical Electron ◽  
Atom Migration ◽  
Beam Damage

Over the past five years it has become evident that radiation damage provides the fundamental limit to the study of blomolecular structure by electron microscopy. In some special cases structural determinations at very low doses can be achieved through superposition techniques to study periodic (Unwin & Henderson, 1975) and nonperiodic (Saxton & Frank, 1977) specimens. In addition, protection methods such as glucose embedding (Unwin & Henderson, 1975) and maintenance of specimen hydration at low temperatures (Taylor & Glaeser, 1976) have also shown promise. Despite these successes, the basic nature of radiation damage in the electron microscope is far from clear. In general we cannot predict exactly how different structures will behave during electron Irradiation at high dose rates. Moreover, with the rapid rise of analytical electron microscopy over the last few years, nvicroscopists are becoming concerned with questions of compositional as well as structural integrity. It is important to measure changes in elemental composition arising from atom migration in or loss from the specimen as a result of electron bombardment.

Analytical Electron Microscopy (AEM) of Meningeal Cells Exposed to Particulate Cobalt During Studies of Experimental Epilepsy

1982 ◽  
Vol 40 ◽  
pp. 186-187
Author(s):  
R.G. Frederickson ◽  
R.G. Ulrich ◽  
J.L. Culberson
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Experimental Epilepsy ◽  
Metallic Cobalt ◽  
Experimental Animals ◽  
X Ray ◽  
Brain Surface ◽  
Meningeal Cells ◽  
Analytical Electron ◽  
The Brain

Metallic cobalt acts as an epileptogenic agent when placed on the brain surface of some experimental animals. The mechanism by which this substance produces abnormal neuronal discharge is unknown. One potentially useful approach to this problem is to study the cellular and extracellular distribution of elemental cobalt in the meninges and adjacent cerebral cortex. Since it is possible to demonstrate the morphological localization and distribution of heavy metals, such as cobalt, by correlative x-ray analysis and electron microscopy (i.e., by AEM), we are using AEM to locate and identify elemental cobalt in phagocytic meningeal cells of young 80-day postnatal opossums following a subdural injection of cobalt particles.

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