Refinements on electron diffraction data of β-glycine in MoPro: a quest for an improved structure model

The advancement in 3D electron diffraction (3D ED) techniques that lead to a revolution in molecular structure determination using nano-sized crystals is now achieving atomic resolution. The structures can be obtained from 3D ED data with tools similar to those used for X-ray structure determination. In this context, the MoPro software, originally designed for structure and charge density refinements using X-ray diffraction data, has been adapted. Structure refinement on 3D ED data was achieved via implementation of electron scattering factors available in the literature and by application of the Mott–Bethe equation to X-ray scattering factors computed from the multipolar atom model. The multipolar model was parametrized using the transferable pseudoatom databanks ELMAM2 and UBDB. Applying the independent atom model (IAM), i.e. spherical neutral atom refinement, to 3D ED data on β-glycine in MoPro resulted in structure and refinement statistics comparable to those obtained from other well known software. Use of the transferred aspherical atom model (TAAM) led to improvement of the refinement statistics and a better fit of the model to the 3D ED data as compared with the spherical atom refinement. The anisotropic displacement parameters of non-H atoms appear underestimated by typically 0.003 Å2 for the non-H atoms in IAM refinement compared with TAAM. Thus, MoPro is shown to be an effective tool for crystal structure refinement on 3D ED data and allows use of a spherical or a multipolar atom model. Electron density databases can be readily transferred with no further modification needed when the Mott–Bethe equation is applied.

A practical solution of the Bethe equation in the energy range applicable to radiotherapy and radionuclide production

While the dose deposition of charged hadrons has received much attention over the last decades starting in 1930 with the publication of the Bethe equation, there are still practical obstacles in implementing it in fields like radiotherapy and isotope production on cyclotrons. This is especially true if the target material consists of non-homogeneous materials, either consisting of a mixture of different elements or experiencing phase changes during irradiation. While Monte-Carlo methods have had great success in describing these more difficult target materials, they come at a computational cost, especially if the problem is time-dependent. This can greatly hinder optimal advancement in therapy and isotope targetry. Here, a regular perturbation method is used to solve the Bethe equation in the limit of small relativistic effects. Particular focus is given to incident energy level relevant to radionuclide production and radiotherapy applications, i.e. 10–200 MeV. We present a series solution for the range and dose distribution in terms of elementary functions, as opposed to special functions which will aid in uptake by practitioners.

What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique?

This article reviews different methods used to perform quantitative X-ray microanalysis in the electron microscope and also demonstrates the urgency of measuring the fundamental parameters of X-ray generation for the development of accurate standardless quantitative methods. Using ratios of characteristic lines acquired on the same X-ray spectrum, it is shown that the Cliff and LorimerKA-Bfactor can be used in a general correction method that is appropriate for all types of specimens and electron microscopes, providing that appropriate corrections are made for X-ray absorption, fluorescence, and indirect generation. Since the fundamental parameters appear in theKA-Bfactor, only the ratio of the ionization cross sections needs to be known, not their absolute values. In this regard, the measurement of ratios of theKA-Bfactor (or intensities at different beam energies of the same material with no change of beam spreading in the material) permits the validation for the best models to compute the ratio of ionization cross sections. It is shown, using this method, that the nonrelativistic Bethe equation, to compute ionization cross section, is very close to the equation of E. Casnati et al. (J Phys B15, 155–167, 1982) and also to the equations proposed by D. Bote and F. Salvat (Phys Rev A77, 042701, 2008) for the computation of the ratio of ionization cross sections. The method is extended to show that it could be used to determine the values of the Coster-Kronig transitions factors, an important fundamental parameter for the generation of L and M lines that is mostly known with poor accuracy. The detector efficiency can be measured with specimens where their intensities were measured with an energy dispersive spectrometer detector, the efficiency of which has been measured in an X-ray synchrotron (M. Alvisi et al.,Microsc Microanal12, 406–415, 2006). The spatial resolution should always be computed when performing quantitative X-ray microanalysis and the equations of R. Gauvin (Microsc Microanal13(5), 354–357, 2007) for bulk materials and the one presented in this article for thin films should be used. The effects of X-rays generated by fast secondary electrons and by Auger electrons are reviewed, and their effect can be detrimental for the spatial resolution of materials involving low-energy X-ray lines, in certain specific conditions. Finally, quantitative X-ray microanalysis of heterogeneous materials is briefly reviewed.