Analytical Electron Microscopy (AEM) of Meningeal Cells Exposed to Particulate Cobalt During Studies of Experimental Epilepsy

1982 ◽  
Vol 40 ◽  
pp. 186-187
Author(s):  
R.G. Frederickson ◽  
R.G. Ulrich ◽  
J.L. Culberson
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Experimental Epilepsy ◽  
Metallic Cobalt ◽  
Experimental Animals ◽  
X Ray ◽  
Brain Surface ◽  
Meningeal Cells ◽  
Analytical Electron ◽  
The Brain

Metallic cobalt acts as an epileptogenic agent when placed on the brain surface of some experimental animals. The mechanism by which this substance produces abnormal neuronal discharge is unknown. One potentially useful approach to this problem is to study the cellular and extracellular distribution of elemental cobalt in the meninges and adjacent cerebral cortex. Since it is possible to demonstrate the morphological localization and distribution of heavy metals, such as cobalt, by correlative x-ray analysis and electron microscopy (i.e., by AEM), we are using AEM to locate and identify elemental cobalt in phagocytic meningeal cells of young 80-day postnatal opossums following a subdural injection of cobalt particles.

The effect of small additions of Cu on precipitation in Al-Mg-Si alloys

1990 ◽  
Vol 48 (2) ◽  
pp. 442-443
Author(s):  
M. Tamizifar ◽  
G. Cliff ◽  
R.W. Devenish ◽  
G.W. Lorimer
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Argon Atmosphere ◽  
Age Hardening ◽  
X Ray ◽  
Transmission Electron ◽  
Heat Treated ◽  
Analytical Electron ◽  
Scanning Transmission

Small additions of copper, <1 wt%, have a pronounced effect on the ageing response of Al-Mg-Si alloys. The object of the present investigation was to study the effect of additions of copper up to 0.5 wt% on the ageing response of a series of Al-Mg-Si alloys and to use high resolution analytical electron microscopy to determine the composition of the age hardening precipitates.The composition of the alloys investigated is given in Table 1. The alloys were heat treated in an argon atmosphere for 30m, water quenched and immediately aged either at 180°C for 15 h or given a duplex treatment of 180°C for 15 h followed by 350°C for 2 h2. The double-ageing treatment was similar to that carried out by Dumolt et al. Analyses of the precipitation were carried out with a HB 501 Scanning Transmission Electron Microscope. X-ray peak integrals were converted into weight fractions using the ratio technique of Cliff and Lorimer.

scholarly journals Analytical electron microscopic evaluation of the effects of paraformaldehyde pretreatment on the reaction of glutaraldehyde with biogenic amines.

1982 ◽  
Vol 30 (5) ◽  
pp. 481-486 ◽  
Author(s):  
R E McClung ◽  
J Wood
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Microscopic Level ◽  
Electron Microscopic Level ◽  
Spectrographic Analysis ◽  
Electron Microscopic ◽  
X Ray ◽  
Microscopic Evaluation ◽  
Analytical Electron ◽  
Dense Product

Analytical electron microscopy was used to determine the quantitative effects of paraformaldehyde pretreatment on the formation of the biogenic amine-glutaraldehyde-chrome complex. Pretreatment with paraformaldehyde prevented the glutaraldehyde-chrome reaction with norepinephrine in the rat adrenal medulla. In contrast to the effect of paraformaldehyde on norepinephrine, pretreatment did not prevent the chrome reaction in serotonin-containing argentaffin cells of the gut. X-Ray energy spectrographic analysis revealed a significant decrease in chrome content in the paraformaldehyde treated tissue, but sufficient chrome did react to produce an electron-dense product. Thus by treating tissue with paraformaldehyde prior to the glutaraldehyde chrome procedure, serotonergic sites may be differentiated from catecholaminergic areas at the electron microscopic level.

Mixed-layer mica-chlorite in very low-grade metaclastites from the Malàguide Complex (Betic Cordilleras, Spain)

Clay Minerals ◽  
2001 ◽  
Vol 36 (3) ◽  
pp. 307-324 ◽  
Author(s):  
M. D. Ruiz Cruz
Keyword(s):  
Electron Microscopy ◽  
Mixed Layer ◽  
Analytical Electron Microscopy ◽  
Low Grade ◽  
X Ray ◽  
Betic Cordilleras ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Microscopy Data ◽  
Ray Patterns

AbstractMixed-layered phyllosilicates with composition intermediate between mica and chlorite were identified in very low-grade metaclastites from the Malàguide Complex (Betic Cordilleras, Spain), and studied by X-ray diffraction, and transmission and analytical electron microscopy. They occur both as small grains in the rock matrix, and associated with muscovitechlorite stacks. Transmission electron microscope observations revealed a transition from chlorite to ordered 1:1 interstratifications through complex 1:2 and 1:3 interstratifications. Analytical electron microscopy data indicate a composition slightly different from the sum of discrete trioctahedral chlorite and dioctahedral mica. The types of layer transitions suggest that mixed-layer formation included two main processes: (1) the replacement of a brucite sheet by a cation sheet in the chlorite structure; and (2) the precipitation of mica-like layers between the chlorite layers. The strongest diffraction lines in oriented X-ray patterns are: 12.60 Å (002), 7.98 Å (003), 4.82 Å (005) and 3.48 Å (007).

Truscottite: composition and ionic substitutions

1979 ◽  
Vol 43 (327) ◽  
pp. 333-336 ◽  
Author(s):  
E. E. Lachowski ◽  
L. W. Murray ◽  
H. F. W. Taylor
Keyword(s):  
Electron Microscopy ◽  
Powder Diffraction ◽  
Analytical Electron Microscopy ◽  
Negligible Effect ◽  
X Ray ◽  
Cell Dimensions ◽  
Analytical Electron

SummaryEleven specimens of natural or synthetic truscottite or gyrolite-truscottite intergrowth were studied by analytical electron microscopy and X-ray powder diffraction. The results suggest that, in absence of substitution, the formula of truscottite is Ca14 (Si24O58)(OH)8 · ∼ 2H2O. Truscottite can accommodate Al and K in absence of each other to the extents of 1.4 atoms of Al or 0.5 atoms of K in the above formula. Substitution of Al causes a small increase in cell dimensions, which can approach those of reyerite, but substitution of K has negligible effect.

Transient Phase Formation During the Growth of Epitaxial CoSi2 by Annealing of Co/Ti Bi-Layers on (100) Si

1995 ◽  
Vol 402 ◽  
Author(s):  
D. J. Miller ◽  
T. I. Selinder ◽  
K. E. Gray
Keyword(s):  
Electron Microscopy ◽  
Reaction Pathway ◽  
Spinel Phase ◽  
Analytical Electron Microscopy ◽  
Inert Gases ◽  
Native Oxide ◽  
Transient Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analytical Electron

AbstractPhase evolution during the annealing of Co/Ti bi-layers on (100) Si has been studied by x-ray diffraction and analytical electron microscopy. X-ray diffraction performed in situ during annealing revealed a reaction pathway involving the formation of a transient phase when epitaxial CoSi2 films were grown. Analytical electron microscopy was used to identify this phase as a spinel-related phase, isostructural with Co2TiO4. This phase grows as a result of the presence of the Ti interlayer and a small amount of oxygen from the annealing ambient. Annealing in vacuum or other purified inert gases yielded polycrystalline CoSi2 films which form via a different reaction pathway that does not involve a spinel phase. This spinel phase may serve both to reduce the native oxide from the underlying Si substrate and to control interdiffusion between Si and Co during the reaction, thereby promoting epitaxial growth.

scholarly journals Localization and chemical forms of cadmium in plant samples by combining analytical electron microscopy and X-ray spectromicroscopy

2006 ◽  
Vol 61 (12) ◽  
pp. 1242-1252 ◽  
Author(s):  
Marie-Pierre Isaure ◽  
Barbara Fayard ◽  
Géraldine Sarret ◽  
Sébastien Pairis ◽  
Jacques Bourguignon
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Chemical Forms ◽  
X Ray ◽  
Plant Samples ◽  
Analytical Electron

Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope

2014 ◽  
Vol 20 (4) ◽  
pp. 1318-1326 ◽  
Author(s):  
Nestor J. Zaluzec
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Solid Angle ◽  
Analytical Electron Microscopy ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Scanning Transmission ◽  
Analytical Formulae ◽  
Detector Configurations

AbstractClosed form analytical equations used to calculate the collection solid angle of six common geometries of solid-state X-ray detectors in scanning and scanning/transmission analytical electron microscopy are presented. Using these formulae one can make realistic comparisons of the merits of the different detector geometries in modern electron column instruments. This work updates earlier formulations and adds new detector configurations.

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