Tritium transport analysis for tokamak exhaust processing system of tritium plant

2020 ◽  
Vol 159 ◽  
pp. 111955
Author(s):  
Qin Zeng ◽  
Wei Shi ◽  
Xiande Wang ◽  
Hongli Chen
2019 ◽  
Vol 140 ◽  
pp. 1-10 ◽  
Author(s):  
Xueli Zhao ◽  
Bing Zhang ◽  
Lei Chen ◽  
Kai Huang ◽  
Songlin Liu

2018 ◽  
Vol 203 (1) ◽  
pp. 48-57 ◽  
Author(s):  
Youshi Zeng ◽  
Shengwei Wu ◽  
Wei Liu ◽  
Guanghua Wang ◽  
Nan Qian ◽  
...  

2013 ◽  
Vol 88 (9-10) ◽  
pp. 2444-2447 ◽  
Author(s):  
F. Franza ◽  
L.V. Boccaccini ◽  
A. Ciampichetti ◽  
M. Zucchetti

2016 ◽  
Vol 113 ◽  
pp. 82-86 ◽  
Author(s):  
Lei Pan ◽  
Hongli Chen ◽  
Qin Zeng

2017 ◽  
Vol 114 ◽  
pp. 26-32 ◽  
Author(s):  
Pinghui Zhao ◽  
Wanli Yang ◽  
Yuanjie Li ◽  
Zhihao Ge ◽  
Xingchen Nie ◽  
...  

2020 ◽  
Vol 153 ◽  
pp. 111501
Author(s):  
Kai Huang ◽  
Xueli Zhao ◽  
Xuebin Ma ◽  
Songlin Liu

2018 ◽  
Vol 205 (4) ◽  
pp. 582-591 ◽  
Author(s):  
Youshi Zeng ◽  
Wenguan Liu ◽  
Wei Liu ◽  
Guanghua Wang ◽  
Yuan Qian ◽  
...  

2020 ◽  
Vol 151 ◽  
pp. 111405 ◽  
Author(s):  
Xueli Zhao ◽  
Muyi Ni ◽  
Baojie Nie ◽  
Bing Zhang ◽  
Lei Chen ◽  
...  

Author(s):  
J. Hefter

Semiconductor-metal composites, formed by the eutectic solidification of silicon and a metal silicide have been under investigation for some time for a number of electronic device applications. This composite system is comprised of a silicon matrix containing extended metal-silicide rod-shaped structures aligned in parallel throughout the material. The average diameter of such a rod in a typical system is about 1 μm. Thus, characterization of the rod morphology by electron microscope methods is necessitated.The types of morphometric information that may be obtained from such microscopic studies coupled with image processing are (i) the area fraction of rods in the matrix, (ii) the average rod diameter, (iii) an average circularity (roundness), and (iv) the number density (Nd;rods/cm2). To acquire electron images of these materials, a digital image processing system (Tracor Northern 5500/5600) attached to a JEOL JXA-840 analytical SEM has been used.


Author(s):  
A. V. Crewe ◽  
M. Ohtsuki

We have assembled an image processing system for use with our high resolution STEM for the particular purpose of working with low dose images of biological specimens. The system is quite flexible, however, and can be used for a wide variety of images.The original images are stored on magnetic tape at the microscope using the digitized signals from the detectors. For low dose imaging, these are “first scan” exposures using an automatic montage system. One Nova minicomputer and one tape drive are dedicated to this task.The principal component of the image analysis system is a Lexidata 3400 frame store memory. This memory is arranged in a 640 x 512 x 16 bit configuration. Images are displayed simultaneously on two high resolution monitors, one color and one black and white. Interaction with the memory is obtained using a Nova 4 (32K) computer and a trackball and switch unit provided by Lexidata.The language used is BASIC and uses a variety of assembly language Calls, some provided by Lexidata, but the majority written by students (D. Kopf and N. Townes).


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