Long-wave infrared emissivity characterization of vanadium dioxide-based multilayer structure on silicon substrate by temperature-dependent radiometric measurements
2018 ◽
Vol 93
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pp. 112-115
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2019 ◽
Vol 36
(6)
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pp. 1015
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Keyword(s):
2009 ◽
Vol 38
(9)
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pp. 1944-1947
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Keyword(s):
2010 ◽
Vol 28
(3)
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pp. C3G13-C3G18
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Keyword(s):
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