Preparation and characterization of sol–gel derived sodium–potassium bismuth titanate powders and thick films deposited by screen printing

2010 ◽  
Vol 495 (1) ◽  
pp. 173-180 ◽  
Author(s):  
Haibo Zhang ◽  
Shenglin Jiang ◽  
Koji Kajiyoshi
Keyword(s):  
Screen Printing ◽  
Bismuth Titanate ◽  
Thick Films ◽  
Sol Gel ◽  
Sodium Potassium

Sol-gel preparation and characterization of transparent GdTaO 4 : Eu3+thick films

2008 ◽  
Author(s):  
Kun Han ◽  
Mu Gu ◽  
Xiaolin Liu ◽  
Chen Ni ◽  
Shiming Huang ◽  
...  
Keyword(s):  
Thick Films ◽  
Sol Gel ◽  
Gel Preparation

Structural and Dielectric Properties of Screen Printed PZT(70/30) Multilayered Thick Films

2007 ◽  
Vol 124-126 ◽  
pp. 663-666 ◽  
Author(s):  
Sung Gap Lee ◽  
Sang Man Park ◽  
Young Jae Shim ◽  
Young Chul Rhee
Keyword(s):  
Screen Printing ◽  
Remanent Polarization ◽  
Thick Films ◽  
Sol Gel ◽  
Relative Dielectric Constant ◽  
Polycrystalline Structure ◽  
Coating Solution ◽  
Screen Printing Method ◽  
Xrd Patterns ◽  
Printing Method

PZT(70/30) powder was prepared by a sol-gel method and PZT thick films were fabricated by the screen-printing method on the alumina substrates. The coating and drying procedure was repeated 4 times. And then the PZT(30/70) precusor solution was spin-coated on the PZT thick films. A concentration of a coating solution was 0.5 mol/L and the number of coating was varied from 0 to 6. The porosity decreased and the grain size increased with increasing the number of coatings. The thickness of the PZT-6(6: number of coatings) films was about 60~65μm. All PZT thick films showed the typical XRD patterns of a typical perovskite polycrystalline structure. The relative dielectric constant of the PZT-6 thick film was 540. The remanent polarization and coercive field of the PZT-6 film were 23.6 μC /cm2, 12.0 kV/cm, respectively.

Sol-Gel Synthesis and Characterization of Nanocrystalline Bi4Ti3O12 Powders

2014 ◽  
Vol 997 ◽  
pp. 359-362 ◽  
Author(s):  
Chun Hong Ma ◽  
Xue Lin ◽  
Liang Wang ◽  
Yong Sheng Yan
Keyword(s):  
Phase Inversion ◽  
Bismuth Titanate ◽  
Sol Gel ◽  
Tetrabutyl Titanate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Sol Gel Synthesis ◽  
Source Materials

Nanocrystalline bismuth titanate (Bi4Ti3O12; BTO) powders were successfully prepared by the sol-gel method, using bismuth nitrate (Bi(NO3)3·5H2O) and tetrabutyl titanate (Ti(OC4H9)4) as source materials, acetic anhydride and ethanediol as solvents. The thermal decomposition and phase inversion process of the gel precursors were studied by using differential thermal analysis (DTA). The crystal structures and microstructures of BTO powders were investigated by using x-ray diffraction (XRD), and transmission electron microscope (TEM). The crystallization of amorphous bismuth titanate has been discussed. The effect of sintering temperature on the structure and morphology of BTO was investigated. At 644 oC and above, BTO powder undergoes a phase transformation from tetragonal to orthorhombic. At 900 oC, the purified orthorhombic BTO nanocrystals were obtained.

Electrical Properties BaTiO3 Thick Films with an Interlayer SrTiO3 Thin Films

2007 ◽  
Vol 124-126 ◽  
pp. 659-662
Author(s):  
Sung Pill Nam ◽  
Sung Gap Lee ◽  
Seong Gi Bae ◽  
Young Hie Lee
Keyword(s):  
Thin Films ◽  
Leakage Current ◽  
Spin Coating ◽  
Screen Printing ◽  
Thick Films ◽  
Sol Gel ◽  
Grain Structure ◽  
Screen Printing Method ◽  
Coating Method ◽  
Printing Method

The BaTiO3/SrTiO3 heterolayered thick films were fabricated by two different methods – thick films of BaTiO3 by screen printing method on alumina substrates electrodes with Pt, thin films of SrTiO3 by the spin-coating method on BaTiO3 thick films and once more thick films of BaTiO3 by the screen printing method on SrTiO3 layer. The leakage current and the dielectric properties were investigated for effect of various stacking sequence of sol-gel-prepared SrTiO3 layer at interface of BaTiO3 thick films. The insertion of SrTiO3 interlayer yielded BaTiO3 thick films with homogeneous and dense grain structure with the number of SrTiO3 layers. The leakage current density of the BaTiO3/SrTiO3-7 film is less that 1.5 10-9 A/cm2 at 5 V.

Synthesis and Characterization of Ba0.3Sr0.7ZrO3 Ceramic Thick Films Prepared by Sol-Gel Technique

2012 ◽  
Vol 620 ◽  
pp. 435-439 ◽  
Author(s):  
Wan Fahmin Faiz Wan Ali ◽  
Mohamad Ariff Othman ◽  
Nik Akmar Rejab ◽  
Mohd Zaid Abdullah ◽  
Arjuna Marzuki ◽  
...  
Keyword(s):  
Thick Films ◽  
Sol Gel ◽  
Dendritic Structure ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gel Technique ◽  
Electrical Permittivity ◽  
Electrical Characterizations

This manuscript is explained and discussed the properties of ceramic thick films, [Ba0.3Sr0.7ZrO3,BSZ (0.7)] synthesized through sol-gel route. The gel decomposition was studied by thermogravinometry analysis (TGA). From thermal analysis, it had shown that BSZ (0.7) phase started formed at 800 °C and above. The crystal structure of this composite film studied exhibited highly polycrystalline materials by X-ray diffraction analysis. From high magnification observation of field emission scanning electron microscopy (FESEM), grain boundaries of BSZ (0.7) films are clearly defined meanwhile grains displayed are in flaky shape. The average diameters of the grains measured were 94.6 nm. However, grains boundaries of BSZ (0.0) films, are unclear and grains slightly look dendritic structure. Electrical characterizations of the films are carried out with impedance analyzer at 4 - 12 GHz respectively. Both of electrical permittivity and loss tangent observed are dependable with microstructural and structural of the films.

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