In-situ STM and XRD studies on Nb–H films: Coherent and incoherent phase transitions

2015 ◽  
Vol 645 ◽  
pp. S388-S391 ◽  
Author(s):  
Vladimir Burlaka ◽  
Stefan Wagner ◽  
Astrid Pundt
1997 ◽  
Vol 502 ◽  
Author(s):  
Ivan Bozovic ◽  
J. N. Eckstein ◽  
Natasha Bozovic ◽  
J. O'Donnell

ABSTRACTReal-time, in-situ surface monitoring by reflection high-energy electron diffraction (RHEED) has been the key enabling component of atomic-layer-by-layer molecular beam epitaxy (ALL-MBE) of complex oxides. RHEED patterns contain information on crystallographic arrangements and long range order on the surface; this can be made quantitative with help of numerical simulations. The dynamics of RHEED patterns and intensities reveal a variety of phenomena such as nucleation and dissolution of secondary-phase precipitates, switching between growth modes (layer-by-layer, step-flow), surface phase transitions (surface reconstruction, roughening, and even phase transitions induced by the electron beam itself), etc. Some of these phenomena are illustrated here, using as a case study our recent growth of atomically smooth a-axis oriented DyBa2Cu3O7 films.


Small Methods ◽  
2021 ◽  
Vol 5 (9) ◽  
pp. 2170042
Author(s):  
Tobias Meyer ◽  
Birte Kressdorf ◽  
Vladimir Roddatis ◽  
Jörg Hoffmann ◽  
Christian Jooss ◽  
...  

2002 ◽  
Vol 517 (1-3) ◽  
pp. 207-218 ◽  
Author(s):  
S Strbac ◽  
R.J Behm ◽  
A Crown ◽  
A Wieckowski
Keyword(s):  

1996 ◽  
Vol 369 (1-3) ◽  
pp. 321-335 ◽  
Author(s):  
Taro Yamada ◽  
Katsuhiko Ogaki ◽  
Shinya Okubo ◽  
Kingo Itaya

2010 ◽  
Vol 12 (32) ◽  
pp. 9276 ◽  
Author(s):  
Sihzih Chen ◽  
Chonzan Hwuang ◽  
HsinLing Tu ◽  
ChunGuey Wu ◽  
ShuehLin Yau ◽  
...  
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document