Intrinsic point defects and grown-in microdefects in silicon crystals—comment on: “Intrinsic point defect behaviour in silicon crystals during growth from the melt: A model derived from experimental results”, T. Abe, T. Takahashi, Journal of Crystal Growth 334 (2011) 16
2012 ◽
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pp. 115-117
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2011 ◽
Vol 178-179
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pp. 3-14
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2011 ◽
Vol 334
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pp. 16-36
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Influence of anisotropic thermal stress during Si crystal growth on intrinsic point defect formation
2017 ◽
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pp. 087
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2013 ◽
Vol 2
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