Grain-size dependence of magnetic microstructure and high-frequency susceptibility of nanocrystalline thin films: a micromagnetic simulation study

2021 ◽  
pp. 167856
Author(s):  
A.V. Izotov ◽  
B.A. Belyaev ◽  
P.N. Solovev ◽  
N.M. Boev
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Simulation Study ◽  
High Frequency ◽  
Size Dependence ◽  
Micromagnetic Simulation ◽  
Magnetic Microstructure ◽  
Nanocrystalline Thin Films

Grain size dependence on layer thickness in composition modulated thin films

1986 ◽  
Vol 4 (5-7) ◽  
pp. 313-315 ◽  
Author(s):  
A.F. Jankowski ◽  
J.F. Shewbridge
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Layer Thickness ◽  
Size Dependence

The yield stress of polycrystalline thin films

1993 ◽  
Vol 8 (2) ◽  
pp. 237-238 ◽  
Author(s):  
C.V. Thompson
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Film Thickness ◽  
Yield Stress ◽  
Size Dependence ◽  
Detailed Understanding ◽  
Polycrystalline Thin Films ◽  
Observed Behavior

In recent experiments it has been shown that the yield stress of polycrystalline thin films depends separately on the film thickness and the grain size. It was also shown that the grain size dependence varies as the reciprocal of the grain size. In this paper an analysis is presented which leads to these results and provides a more detailed understanding of the origins of the observed behavior.

Emergence of film-thickness- and grain-size-dependent elastic properties in nanocrystalline thin films

2013 ◽  
Vol 68 (5) ◽  
pp. 261-264 ◽  
Author(s):  
Jie Lian ◽  
Seok-Woo Lee ◽  
Lorenzo Valdevit ◽  
Michael I. Baskes ◽  
Julia R. Greer
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Film Thickness ◽  
Elastic Properties ◽  
Size Dependent ◽  
Nanocrystalline Thin Films
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