The resistive-heating characterization of laser heating system and LaB6 characterization of X-ray diffraction of beamline 12.2.2 at advanced light source

2010 ◽  
Vol 71 (8) ◽  
pp. 1179-1182 ◽  
Author(s):  
Jinyuan Yan ◽  
Jason Knight ◽  
Martin Kunz ◽  
Selva Vennila Raju ◽  
Bin Chen ◽  
...  
Keyword(s):  
Light Source ◽  
Laser Heating ◽  
Heating System ◽  
X Ray Diffraction ◽  
Resistive Heating ◽  
X Ray ◽  
Advanced Light Source

scholarly journals Laser-heating system for high-pressure X-ray diffraction at the Extreme Conditions beamline I15 at Diamond Light Source

2018 ◽  
Vol 25 (6) ◽  
pp. 1860-1868 ◽  
Author(s):  
Simone Anzellini ◽  
Annette K. Kleppe ◽  
Dominik Daisenberger ◽  
Michael T. Wharmby ◽  
Ruggero Giampaoli ◽  
...  
Keyword(s):  
Light Source ◽  
Laser Heating ◽  
Theoretical Data ◽  
Heating System ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Wide Range ◽  
Diamond Anvil

In this article, the specification and application of the new double-sided YAG laser-heating system built on beamline I15 at Diamond Light Source are presented. This system, combined with diamond anvil cell and X-ray diffraction techniques, allows in situ and ex situ characterization of material properties at extremes of pressure and temperature. In order to demonstrate the reliability and stability of this experimental setup over a wide range of pressure and temperature, a case study was performed and the phase diagram of lead was investigated up to 80 GPa and 3300 K. The obtained results agree with previously published experimental and theoretical data, underlining the quality and reliability of the installed setup.

scholarly journals X-Ray Diffraction under Extreme Conditions at the Advanced Light Source

2018 ◽  
Vol 2 (1) ◽  
pp. 4 ◽  
Author(s):  
Camelia Stan ◽  
Christine Beavers ◽  
Martin Kunz ◽  
Nobumichi Tamura
Keyword(s):  
Light Source ◽  
Extreme Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Advanced Light Source

scholarly journals High Pressure Diffraction for the Geosciences at the Advanced Light Source

2014 ◽  
Vol 70 (a1) ◽  
pp. C1097-C1097
Author(s):  
Christine Beavers ◽  
Jason Knight ◽  
Bora Kalkan ◽  
Jinyuan Yan ◽  
Alastair MacDowell ◽  
...  
Keyword(s):  
High Pressure ◽  
Light Source ◽  
High Pressures ◽  
X Rays ◽  
X Ray Diffraction ◽  
User Friendliness ◽  
X Ray ◽  
Advanced Light Source ◽  
Diamond Anvil ◽  
Multiple Detectors

The Advanced Light Source, in concert with COMPRES, supports a superconducting bending magnet beamline devoted to extreme conditions diffraction. This facility, beamline 12.2.2, is aimed at the geoscience community, but is available to any who desire high pressures, high temperatures and hard X-rays. The latest development has been integrating single crystal x-ray diffraction for diamond anvil cells into the existing suite of high pressure powder diffraction and amorphous scattering techniques. Multiple heating techniques are available to the user, as well as multiple detectors, which can be chosen to best suit the sample. The current staff are dedicated to improving the user friendliness of the beamline; a difficult experiment need not to be further complicated by a difficult beamline. Beamline infrastructure, including recent advances and improvements, will be discussed.

scholarly journals ALS-II, a Potential Soft X-ray, Diffraction Limited Upgrade of the Advanced Light Source

2014 ◽  
Vol 493 ◽  
pp. 012020 ◽  
Author(s):  
H Tarawneh ◽  
C Steier ◽  
R Falcone ◽  
D Robin ◽  
H Nishimura ◽  
...  
Keyword(s):  
Light Source ◽  
X Ray Diffraction ◽  
X Ray ◽  
Advanced Light Source

Double-sided laser heating system forin situhigh pressure–high temperature monochromatic x-ray diffraction at the esrf

2005 ◽  
Vol 25 (1) ◽  
pp. 71-83 ◽  
Author(s):  
E. Schultz ◽  
M. Mezouar ◽  
W. Crichton ◽  
S. Bauchau ◽  
G. Blattmann ◽  
...  
Keyword(s):  
High Temperature ◽  
Laser Heating ◽  
Heating System ◽  
X Ray Diffraction ◽  
X Ray

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

X-ray microscopy by phase-retrieval methods at the advanced light source

2003 ◽  
Vol 104 ◽  
pp. 557-561 ◽  
Author(s):  
M. R. Howells ◽  
H. Chapman ◽  
S. Hau-Riege ◽  
H. He ◽  
S. Marchesini ◽  
...  
Keyword(s):  
Light Source ◽  
Phase Retrieval ◽  
X Ray ◽  
Advanced Light Source
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