Revealing two distinctive intergranular cracking mechanisms of Ni-rich layered cathode by cross-sectional scanning electron microscopy

2021 ◽  
Vol 503 ◽  
pp. 230066
Author(s):  
Haoqi Wu ◽  
Changdong Qin ◽  
Kuan Wang ◽  
Xiao Han ◽  
Manling Sui ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Intergranular Cracking ◽  
Cross Sectional ◽  
Cracking Mechanisms ◽  
Scanning Electron

Characterization of Thin Polymer Blend Films using ESEM – No Charging, No Staining.

2001 ◽  
Vol 707 ◽  
Author(s):  
Ian C. Bache ◽  
Catherine M. Ramsdale ◽  
D. Steve Thomas ◽  
Ana-Claudia Arias ◽  
J. Devin MacKenzie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Environmental Scanning Electron Microscopy ◽  
Environmental Scanning ◽  
Cross Sectional ◽  
Blend Films ◽  
Thin Polymer ◽  
Device Applications ◽  
Scanning Electron

ABSTRACTCharacterising the morphology of thin films for use in device applications requires the ability to study both the structure within the plane of the film, and also through its thickness. Environmental scanning electron microscopy has proved to be a fruitful technique for the study of such films both because contrast can be seen within the film without the need for staining (as is conventionally done for electron microscopy), and because cross-sectional images can be obtained without charging artefacts. The application of ESEM to a particular blend of relevance to photovoltaics is described.

Stability and Performance Study of Polyethersulfone Membranes Modified Using Polyelectrolytes

2013 ◽  
Vol 65 (4) ◽  
Author(s):  
Law Yong Ng ◽  
Abdul Wahab Mohammad ◽  
Ching Yin Ng ◽  
Nur Hanis Hayati Hairom
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Research Work ◽  
Performance Study ◽  
Salt Solutions ◽  
Cross Sectional ◽  
And Performance ◽  
Surface Modified ◽  
Lower Contact ◽  
Scanning Electron

In this research work, porous PES membranes were initially pre-heated for certain duration of time and then surface-modified to reject the MgSO4 salt solutions through self-adsorption of polyelectrolytes. From the experimental work, higher membrane salt rejection capability can be obtained when the number of polyelectrolyte bilayers is increased. The images of the cross-sectional morphology of modified and non-modified membranes were obtained using field emission scanning electron microscopy (FESEM). All modified membranes showed relatively lower contact angle values.

A Scanning Electron Microscopy Study of the Attachment of a Thromboresistive Surface Coating to a Membrane Blood Oxygenator

1977 ◽  
Vol 35 ◽  
pp. 326-327
Author(s):  
H. S. Borovetz ◽  
R. K. Matta ◽  
K. J. Goitein ◽  
T.-K. Hung ◽  
M. H. Weissman ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Blood Flow ◽  
Microscopy Study ◽  
Porous Membrane ◽  
Electron Microscopy Study ◽  
Cross Sectional ◽  
Scanning Electron Microscopy Study ◽  
Micro Channels ◽  
Scanning Electron

The need for systemic heparin anticoagulation during extended cardiopulmonary bypass (CPB) remains a serious impediment to clinical CPB support of circulatory and respiratory failures, especially in the newborn. Recent development of thromboresistive substrates which can be used to treat extracorporeal surfaces in contact with blood offers the potential for elimination of systemic blood heparinization. The present paper describes a scanning electron microscopy study of the attachment of one such substrate, tridodecyl- methylammonium chloride (TDMAC), to a novel micro-membrane oxygenator.Figure 1 shows a cross-sectional image of the alternating pattern of microchannel conduits for blood flow through the oxygenator. The micro-channels were fabricated on thin metal sheets with an approximate semi-circular shape (150 + 25 microns in radius). The gas exchange to the blood flow in the channels was accomplished through a micro-porous membrane which was placed across the diametric plane of the channels (1).

Scanning Electron Microscopy Observation of Interface Between Single Neurons and Conductive Surfaces

2016 ◽  
Vol 16 (4) ◽  
pp. 3383-3387 ◽  
Author(s):  
Toichiro Goto ◽  
Nahoko Kasai ◽  
Rick Lu ◽  
Roxana Filip ◽  
Koji Sumitomo
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Indium Tin Oxide ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Single Neurons ◽  
Sem Images ◽  
Cross Sectional ◽  
Integrated Devices ◽  
Scanning Electron

Interfaces between single neurons and conductive substrates were investigated using focused ion beam (FIB) milling and subsequent scanning electron microscopy (SEM) observation. The interfaces play an important role in controlling neuronal growth when we fabricate neuron-nanostructure integrated devices. Cross sectional images of cultivated neurons obtained with an FIB/SEM dual system show the clear affinity of the neurons for the substrates. Very few neurons attached themselves to indium tin oxide (ITO) and this repulsion yielded a wide interspace at the neuron-ITO interface. A neuron-gold interface exhibited partial adhesion. On the other hand, a neuron-titanium interface showed good adhesion and small interspaces were observed. These results are consistent with an assessment made using fluorescence microscopy. We expect the much higher spatial resolution of SEM images to provide us with more detailed information. Our study shows that the interface between a single neuron and a substrate offers useful information as regards improving surface properties and establishing neuron-nanostructure integrated devices.

Analysis of yarn fiber volume fraction in textile composites using scanning electron microscopy and X-ray micro-computed tomography

2018 ◽  
Vol 38 (5) ◽  
pp. 199-210 ◽  
Author(s):  
Xiu-Wei Yu ◽  
Hao Wang ◽  
Zhong-Wei Wang
Keyword(s):  
Electron Microscopy ◽  
Computed Tomography ◽  
Scanning Electron Microscopy ◽  
Fiber Volume Fraction ◽  
Volume Fraction ◽  
Textile Composites ◽  
Micro Computed Tomography ◽  
Fiber Volume ◽  
Cross Sectional ◽  
Scanning Electron

Variation of yarn fiber volume fraction, induced by the compression between adjacent yarns during the manufacturing process of textile composites, is difficult to be determined by using a single imaging method. A method combining scanning electron microscopy and micro-computed tomography is proposed to quantify the variation of yarn fiber volume fraction of textile composites, which is decomposed into systematic trend and stochastic deviation. The method takes the advantages of high resolution of scanning electron microscopy and wide 3D view of micro-computed tomography. Average fiber cross-sectional areas are acquired by analyzing hundreds of fiber cross-sectional areas in scanning electron microscopic images. Yarn cross-sectional area is determined by fitting ellipse to the labeled yarn cross-section in slices of micro-computed tomography images. The results of E-glass/epoxy and carbon/epoxy specimens show that their systematic trends of yarn fiber volume fraction combined with standard deviations of stochastic deviation, relative to the respective global means, fluctuate between [−11.4%, 15.3%] and [−12.9%, 10.7%], respectively. Yarn FVF varies in specimen obviously and needs to be considered in mechanical property prediction.

The Formation Mechanism of Carrot Defects in SiC Epifilms

2006 ◽  
Vol 911 ◽  
Author(s):  
Hui Chen ◽  
Guan Wang ◽  
Yi Chen ◽  
Xiaoting Jia ◽  
Jie Bai ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Mechanism Of Formation ◽  
Cross Sectional ◽  
Screw Dislocations ◽  
X Ray ◽  
Transmission Electron ◽  
Sic Wafer ◽  
Scanning Electron

AbstractCarrot-like defects in a 7&#61616; off-cut (from [0001] toward <1-210> direction) 4H-SiC wafer with a 36μm thick 4H-SiC epilayer have been investigated using Nomarski optical microscopy, synchrotron white beam x-ray topography (SWBXT), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). X-ray topographs confirm that threading screw dislocations are often associated with the carrots. Cross-sectional TEM observation confirms that a prismatic stacking fault exists below the carrot. This fault was found to show contrast in all observed diffraction geometries except for g=0004. A model for the mechanism of formation of this type of defect during epitaxial growth is proposed.

scholarly journals Electrochemical Formation of Cerium Oxide/Layered Silicate Nanocomposite Films

2016 ◽  
Vol 2016 ◽  
pp. 1-7 ◽  
Author(s):  
Adele Qi Wang ◽  
Teresa Diane Golden
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cerium Oxide ◽  
Layered Silicate ◽  
Nanocomposite Films ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
X Ray ◽  
Scanning Electron

Cerium oxide/montmorillonite nanocomposite films were synthesized electrochemically from solutions containing 0.5 to 50% Na-montmorillonite. The nanocomposites were characterized by X-ray diffraction, scanning electron microscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. Nanocomposite films synthesized from montmorillonite concentrations lower than 10% were continuous, uniform, and dense. X-ray diffraction confirmed that the nanocomposite films retain the face-centered cubic structure of cerium oxide while incorporating exfoliated platelets of the montmorillonite into the matrix. In addition, calculations from XRD data showed particle sizes ranging from 4.50 to 6.50 nm for the nanocomposite coatings. Raman and FTIR spectroscopy had peaks present for cerium oxide and the layered silicates in the coatings. Cross-sectional scanning electron microscopy and energy-dispersive X-ray spectroscopy confirmed the presence of montmorillonite throughout the cerium oxide matrix.

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