The photochromic process of polyoxometalate-based nanocomposite thin film by in situ AFM and spectroscopy

2006 ◽  
Vol 98 (2-3) ◽  
pp. 347-352 ◽  
Author(s):  
Wei Feng ◽  
Yongsheng Ding ◽  
Yan Liu ◽  
Ran Lu
Keyword(s):  
Thin Film ◽  
Nanocomposite Thin Film

The Nanocrystallinity Enhancement of Sol-Gel Derived TiO2 Nanoparticles by Pre-Hydrothermal Treatment

2011 ◽  
Vol 415-417 ◽  
pp. 715-719 ◽  
Author(s):  
Akhmad Herman Yuwono ◽  
Yu Zhang ◽  
John Wang
Keyword(s):  
Thin Film ◽  
Hydrothermal Treatment ◽  
Polymethyl Methacrylate ◽  
Sol Gel ◽  
Nanocomposite Thin Film ◽  
New Class ◽  
Sol Gel Process ◽  
Optoelectronic Applications ◽  
Processing Techniques

Nanocomposite thin film containing TiO2nanoparticles in polymethyl methacrylate (PMMA) is a new class of potential materials for optoelectronic applications. Among the various processing techniques for these nanocomposites, in situ sol−gel process is well known to be versatile as it enables control of the inorganic-organic interaction at various molecular, nanometer and micrometer scales. However, the resulting TiO2phase is largely amorphous, as a consequence of the relatively low processing temperatures. Therefore, the current research is aimed at enhancing the nanocrystallinity of TiO2nanoparticles in nanocomposites. For this purpose, pre-hydrothermal treatment was carried on the inorganic sols. The nanocrystallinity degree of the resulting TiO2nanoparticles was studied by XRD and FTIR. The studies showed that the nanocrystallinity of TiO2nanoparticles synthesized from the inorganic sol can be enhanced significantly by the pre-hydrothermal treatment, as a result of the completion of hydrolysis stage during sol-gel process.

Preparation of cellulose acetate membrane coated by PVA/Fe3O4 nanocomposite thin film: an in situ procedure

2018 ◽  
Vol 296 (7) ◽  
pp. 1213-1223 ◽  
Author(s):  
Mohammad Nouri ◽  
Azam Marjani ◽  
Majid Tajdari ◽  
Farhad Heidary ◽  
Mahmoud Salimi
Keyword(s):  
Thin Film ◽  
Cellulose Acetate ◽  
Cellulose Acetate Membrane ◽  
Nanocomposite Thin Film

The use of transmission and analytical electron microscopy in studying reactions and phase transformations in thin film

1993 ◽  
Vol 51 ◽  
pp. 842-843
Author(s):  
K. Barmak
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Transformations ◽  
Analytical Electron Microscopy ◽  
Ex Situ ◽  
Multilayer Thin Films ◽  
Absolute Concentration ◽  
Analytical Electron ◽  
Deposition Step

Generally, processing of thin films involves several annealing steps in addition to the deposition step. During the annealing steps, diffusion, transformations and reactions take place. In this paper, examples of the use of TEM and AEM for ex situ and in situ studies of reactions and phase transformations in thin films will be presented.The ex situ studies were carried out on Nb/Al multilayer thin films annealed to different stages of reaction. Figure 1 shows a multilayer with dNb = 383 and dAl = 117 nm annealed at 750°C for 4 hours. As can be seen in the micrograph, there are four phases, Nb/Nb3-xAl/Nb2-xAl/NbAl3, present in the film at this stage of the reaction. The composition of each of the four regions marked 1-4 was obtained by EDX analysis. The absolute concentration in each region could not be determined due to the lack of thickness and geometry parameters that were required to make the necessary absorption and fluorescence corrections.

Growth kinetics of Al2Cu in an Al-1.5Cu thin film by in Situ TEM

1993 ◽  
Vol 51 ◽  
pp. 1172-1173
Author(s):  
M. Park ◽  
S.J. Krause ◽  
S.R. Wilson
Keyword(s):  
Thin Film ◽  
In Situ Tem ◽  
Collector Plate ◽  
Transmission Electron ◽  
Device Processing ◽  
Corrosion Susceptibility ◽  
Precipitation Phenomena ◽  
Semiconductor Chips ◽  
Kinetics Of

Cu alloying in Al interconnection lines on semiconductor chips improves their resistance to electromigration and hillock growth. Excess Cu in Al can result in the formation of Cu-rich Al2Cu (θ) precipitates. These precipitates can significantly increase corrosion susceptibility due to the galvanic action between the θ-phase and the adjacent Cu-depleted matrix. The size and distribution of the θ-phase are also closely related to the film susceptibility to electromigration voiding. Thus, an important issue is the precipitation phenomena which occur during thermal device processing steps. In bulk alloys, it was found that the θ precipitates can grow via the grain boundary “collector plate mechanism” at rates far greater than allowed by volume diffusion. In a thin film, however, one might expect that the growth rate of a θ precipitate might be altered by interfacial diffusion. In this work, we report on the growth (lengthening) kinetics of the θ-phase in Al-Cu thin films as examined by in-situ isothermal aging in transmission electron microscopy (TEM).

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