Interfacial strengths of organosilicate glasses deposited on silicon wafers
2008 ◽
Vol 108
(1)
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pp. 115-119
1986 ◽
Vol 44
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pp. 882-883
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2004 ◽
Vol 27
(1-3)
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pp. 435-438
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Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer
2013 ◽
Vol 58
(2)
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pp. 142-150
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Keyword(s):
High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes
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2019 ◽
Vol 23
(3)
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pp. 283-290
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2016 ◽
Vol 6
(1)
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pp. 126-135
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Keyword(s):
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2021 ◽
pp. 095440622098384