Effect of tip length and normal and lateral contact stiffness on the flexural vibration responses of atomic force microscope cantilevers

2004 ◽  
Vol 71 (1) ◽  
pp. 15-20 ◽  
Author(s):  
Tser-Son Wu ◽  
Win-Jin Chang ◽  
Jung-Chang Hsu
Keyword(s):  
Atomic Force Microscope ◽  
Contact Stiffness ◽  
Flexural Vibration ◽  
Lateral Contact ◽  
Atomic Force ◽  
Vibration Responses

Nonlinear vibration of rectangular atomic force microscope cantilevers by considering the Hertzian contact theory

2010 ◽  
Vol 88 (5) ◽  
pp. 333-348 ◽  
Author(s):  
Ali Sadeghi ◽  
Hassan Zohoor
Keyword(s):  
Atomic Force Microscope ◽  
Timoshenko Beam ◽  
Frequency Ratio ◽  
Contact Stiffness ◽  
Sample Surface ◽  
Hertzian Contact ◽  
Nonlinear Frequency ◽  
Lateral Contact ◽  
Atomic Force ◽  
Contact Position

The nonlinear flexural vibration for a rectangular atomic force microscope cantilever is investigated by using Timoshenko beam theory. In this paper, the normal and tangential tip–sample interaction forces are found from a Hertzian contact model and the effects of the contact position, normal and lateral contact stiffness, tip height, thickness of the beam, and the angle between the cantilever and the sample surface on the nonlinear frequency to linear frequency ratio are studied. The differential quadrature method is employed to solve the nonlinear differential equations of motion. The results show that softening behavior is seen for most cases and by increasing the normal contact stiffness, the frequency ratio increases for the first mode, but for the second mode, the situation is reversed. The nonlinear-frequency to linear-frequency ratio increases by increasing the Timoshenko beam parameter, but decreases by increasing the contact position for constant amplitude for the first and second modes. For the first mode, the frequency ratio decreases by increasing both of the lateral contact stiffness and the tip height, but increases by increasing the angle α between the cantilever and sample surface.

Increasing the Image Contrast of Atomic Force Microscope by Using Improved Rectangular Micro Cantilever

2011 ◽  
Vol 110-116 ◽  
pp. 4888-4892
Author(s):  
Ali Sadeghi
Keyword(s):  
Atomic Force Microscope ◽  
Contact Stiffness ◽  
Beam Theory ◽  
Flexural Vibration ◽  
Sample Surface ◽  
Limited Range ◽  
Image Contrast ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Micro Cantilever

The resonant frequency of flexural vibrations for an atomic force microscope (AFM) cantilever has been investigated using the Euler-Bernoulli beam theory. The results show that for flexural vibration the frequency is sensitive to the contact position, the first frequency is sensitive only to the lower contact stiffness, but high order modes are sensitive in a larger range of contact stiffness. By increasing the height H, for a limited range of contact stiffness the sensitivity to the contact stiffness increases. This sensitivity controls the image contrast, or image quality. Furthermore, by increasing the angle between the cantilever and sample surface, the frequency decreases.

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