Physics-of-failure assessment methodology for power electronic systems

2014 ◽  
Vol 54 (9-10) ◽  
pp. 1680-1685 ◽  
Author(s):  
D. Squiller ◽  
H. Greve ◽  
E. Mengotti ◽  
F.P. McCluskey
Author(s):  
Anunay Gupta ◽  
Om Prakash Yadav ◽  
Douglas DeVoto ◽  
Joshua Major

This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems — metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.


2002 ◽  
Vol 122 (8) ◽  
pp. 775-780
Author(s):  
Yasuaki Kuroe ◽  
Mikihiko Matsui

2007 ◽  
Author(s):  
R. E. Crosbie ◽  
J. J. Zenor ◽  
R. Bednar ◽  
D. Word ◽  
N. G. Hingorani

2020 ◽  
Vol 9 (3) ◽  
pp. 63-72
Author(s):  
Andreas Bendicks ◽  
Tobias Dorlemann ◽  
Timo Osterburg ◽  
Stephan Frei

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