First investigation of liposomes behavior and phospholipids organization in choline chloride-based deep eutectic solvents by atomic force microscopy

2020 ◽  
Vol 306 ◽  
pp. 112851 ◽  
Author(s):  
Jad Eid ◽  
Tracy El Achkar ◽  
Sophie Fourmentin ◽  
Hélène Greige-Gerges ◽  
Alia Jraij
Keyword(s):  
Atomic Force Microscopy ◽  
Choline Chloride ◽  
Deep Eutectic Solvents ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

Metals ◽  
2020 ◽  
Vol 10 (11) ◽  
pp. 1455
Author(s):  
Sabrina Patricia Rosoiu ◽  
Aida Ghiulnare Pantazi ◽  
Aurora Petica ◽  
Anca Cojocaru ◽  
Stefania Costovici ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Electrochemical Impedance ◽  
Composite Coatings ◽  
Choline Chloride ◽  
Physicochemical Characterization ◽  
Metallic Matrix ◽  
Deep Eutectic Solvents ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reduced Graphene

The present work describes, for the first time, the electrodeposition of NiSn alloy/reduced graphene oxide composite coatings (NiSn-rGO) obtained under pulse current electrodeposition conditions from deep eutectic solvents (choline chloride: ethylene glycol eutectic mixtures) containing well-dispersed GO nanosheets. The successful incorporation of the carbon-based material into the metallic matrix has been confirmed by Raman spectroscopy and cross-section scanning electron microscopy (SEM). A decrease in the crystallite size of the coating was evidenced when graphene oxide was added to the electrolyte. Additionally, the topography and the electrical properties of the materials were investigated by atomic force microscopy (AFM). The corrosion behavior in 0.5 M NaCl solution was analyzed through potentiodynamic polarization and electrochemical impedance spectroscopy methods for different immersion periods, up to 336 h, showing a slightly better corrosion performance as compared to pure NiSn alloy.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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