Experimental and numerical investigations of void damage in aluminum alloy welds under thermal cycling condition

2009 ◽  
Vol 499 (1-2) ◽  
pp. 171-176 ◽  
Author(s):  
Cheng Jin ◽  
Shiyu He ◽  
GuangtaoZhou ◽  
Chengbin Fu
2012 ◽  
Vol 482-484 ◽  
pp. 981-984
Author(s):  
Cheng Jin ◽  
Chun Yuan Shi

Effects of thermal cycling on the tensile strength of aluminum alloy welded joints are studied experimentally in this paper. The damage mechanisms are also analyzed based on the microstructure observations. Results reveal that certain thermal cycling can cause strength decrease especially at the heat affected zone of the aluminum alloy welded joint. The cyclic temperature and the external load are the key factors which influence the strength of the welded joint specimens, while the cyclic period has a minor effect in thermal cycling conditions. Microstructure analysis also shows that voids nucleation and evolution governs the damage process under thermal cycling condition.


2012 ◽  
Vol 52 (7) ◽  
pp. 1441-1444 ◽  
Author(s):  
Yunsung Kim ◽  
Hyelim Choi ◽  
Hyoungjoo Lee ◽  
Dongjun Shin ◽  
Jinhan Cho ◽  
...  

2007 ◽  
Vol 539-543 ◽  
pp. 368-373 ◽  
Author(s):  
Cheng Jin ◽  
Ji Tai Niu ◽  
Shi Yu He ◽  
Hong Bin Geng ◽  
G. Long

In this paper, the micro-damage mechanisms of 5A06 Al alloy weld joints have been studied under the condition of constant load and cyclic thermal load. The mechanical performance variation of the base material and its weld joint are analyzed and compared. Microstructure analysis reveals that the main damage mechanism in weld joints is the interior voids nucleation and growth. The voids distribution and evolution govern the damage process. Test results also show most fractures occur at HAZ near the welding fusion line. The development of these voids results in the performance deterioration of the weld joints under thermal cycling condition.


2019 ◽  
Vol 141 (4) ◽  
Author(s):  
John H. Lau

The recent advances and trends in fan-out wafer/panel-level packaging (FOW/PLP) are presented in this study. Emphasis is placed on: (A) the package formations such as (a) chip first and die face-up, (b) chip first and die face-down, and (c) chip last or redistribution layer (RDL)-first; (B) the RDL fabrications such as (a) organic RDLs, (b) inorganic RDLs, (c) hybrid RDLs, and (d) laser direct imaging (LDI)/printed circuit board (PCB) Cu platting and etching RDLs; (C) warpage; (D) thermal performance; (E) the temporary wafer versus panel carriers; and (F) the reliability of packages on PCBs subjected to thermal cycling condition. Some opportunities for FOW/PLP will be presented.


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