First results on charge collection efficiency of heavily irradiated microstrip sensors fabricated on oxygenated p-type silicon
2004 ◽
Vol 518
(1-2)
◽
pp. 340-342
◽
Keyword(s):
1993 ◽
Vol 32
◽
pp. 415-424
◽
2008 ◽
Vol 591
(1)
◽
pp. 178-180
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Keyword(s):
2017 ◽
Vol 127
◽
pp. 130-136
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Keyword(s):
2007 ◽
Vol 581
(1-2)
◽
pp. 322-325
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2008 ◽
Vol 600-603
◽
pp. 1043-1046
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3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency
2013 ◽
Vol 8
(03)
◽
pp. C03023-C03023
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1983 ◽
Vol 30
(6)
◽
pp. 4493-4500
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2016 ◽
Vol 55
(4)
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pp. 046401
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