Efficiency calibration of an extended-range Ge detector by a detailed Monte Carlo simulation

2007 ◽  
Vol 580 (1) ◽  
pp. 296-298 ◽  
Author(s):  
V. Peyres ◽  
E. García-Toraño
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Efficiency Calibration ◽  
Extended Range ◽  
Ge Detector

scholarly journals Efficiency calibration of a well-type HPGe detector using experimental and Monte Carlo simulation techniques

2020 ◽  
Vol 35 (2) ◽  
pp. 121-129
Author(s):  
Ekaterini Dalaka ◽  
Georgios Kuburas ◽  
Konstantinos Eleftheriadis ◽  
Marios Anagnostakis
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Background Radiation ◽  
Detection Efficiency ◽  
Environmental Radioactivity ◽  
Efficiency Calibration ◽  
Small Samples ◽  
Experimental Calibration ◽  
Simulation Techniques ◽  
Radioactivity Laboratory

Well-type high-purity germanium detectors are well suited for the analysis of small samples, as they combine high detection efficiency with low background radiation. The well geometry however makes efficiency calibration more difficult than that of ordinary HPGe detectors, due to intense true coincidence and possibly random summing effects. Such a detector has been installed at the Environmental Radioactivity Laboratory of the National Centre for Scientific Research "Demokritos". For the calibration of this detector, experimental and Monte Carlo simulation techniques were applied. To this end, calibration sources were produced from the radionuclides available at the Environmental Radioactivity Laboratory. Starting from the geometrical characteristics of the detector as provided by the manufacturer, using the calibration sources and applying Monte Carlo simulation techniques, the detector was characterized and peak efficiency, as well as total-to-peak calibration curves were produced. The results of the calibration finally obtained by simulation are found to be in good agreement with the respective experimental calibration results.

scholarly journals Calibration and Monte-Carlo Simulation of the Detection System PTOLEMEOS

2020 ◽  
Vol 6 ◽  
pp. 152
Author(s):  
K. Spyrou ◽  
C. Chronidou ◽  
S. Harissopulos ◽  
E. Kossionides ◽  
T. Paradellis
Keyword(s):  
Experimental Data ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Nuclear Reactions ◽  
Detection System ◽  
Efficiency Calibration ◽  
Astrophysical Interest ◽  
Γ Ray

Monte-Carlo simulation and efficiency calibration of the 4π Nal γ-ray detection system PTOLEMEOS is presented. This system is dedicated to the study of nuclear reactions of astrophysical interest. The simulation is evaluated with experimental data.

Design of an Extended Range Long Counter Using Super Monte Carlo Simulation

2016 ◽  
Author(s):  
Mohamed Mazunga ◽  
Taosheng Li ◽  
Yanan Li ◽  
Bing Hong ◽  
Yongfeng Wang ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Extended Range

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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