Kinetics of propagation of the lattice excitation in a swift heavy ion track

Author(s):  
V.P. Lipp ◽  
A.E. Volkov ◽  
M.V. Sorokin ◽  
B. Rethfeld
1989 ◽  
Vol 110 (1-2) ◽  
pp. 145-147 ◽  
Author(s):  
J. P. Grandin ◽  
D. Hennecart ◽  
X. Husson ◽  
D. Lecler ◽  
I. Lesteven-Vaïsse

RSC Advances ◽  
2016 ◽  
Vol 6 (106) ◽  
pp. 104425-104432 ◽  
Author(s):  
Mukesh Rawat ◽  
Arkaprava Das ◽  
D. K. Shukla ◽  
Parasmani Rajput ◽  
A. Chettah ◽  
...  

Monoclinic-to-tetragonal phase transformation (PT) in sputtering grown zirconium oxide (ZrO2) films on silicon substrates by electronic excitation (EE) induced by swift heavy ion (SHI) irradiation is reported.


Author(s):  
Stanislav Minárik

Abstract While passing swift heavy ion through a material structure, it produces a region of radiation affected material which is known as a "latent track". Scattering motions of electrons interacting with a swift heavy ion are dominant in the latent track region. These phenomena include the electron impurity and phonon scattering processes modified by the interaction with the ion projectile as well as the Coulomb scattering between two electrons. In this paper, we provide detailed derivation of a 3D Boltzmann scattering equation for the description of the relative scattering motion of such electrons. Phase-space distribution function for this non-equilibrioum system of scattering electrons can be found by the solution of mentioned equation.


RSC Advances ◽  
2021 ◽  
Vol 11 (42) ◽  
pp. 26218-26227
Author(s):  
R. Panda ◽  
S. A. Khan ◽  
U. P. Singh ◽  
R. Naik ◽  
N. C. Mishra

Swift heavy ion (SHI) irradiation in thin films significantly modifies the structure and related properties in a controlled manner.


Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...


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